Laboratory Automation Device Treatment Arm X-Direction Alignment
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Solution Overview
Problem
Existing laboratory automation devices are limited in throughput due to the spatial dependency of treatment tools, which prevents simultaneous processing of multiple probe slices when their areas of interest have varying positions in the X-direction.
Innovation Solution
A method and system that aligns the areas of interest of multiple probe slices on a common X-coordinate by moving object slides and treatment tools relative to each other, allowing parallel treatment using a multi-channel treatment arm.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple treatment tools are arranged at a multi-channel treatment arm extending in the Y-direction only, then the treatment tools can be moved individually along the treatment arm to compensate for variations in the Y-direction, but the treatment tools share a common X-coordinate and cannot compensate for variations in the X-direction, limiting parallel processing capability
Solution Approach 1:
The treatment arm is extended from a single-direction (Y-direction only) configuration to a two-dimensional configuration by adding X-direction extension capability. This allows treatment tools to reach different X-coordinates independently, enabling parallel processing of multiple probe slices with varying X-position areas of interest while maintaining the multi-channel architecture
2Measurement precision
If the treatment arm is moved in the X-direction to align one treatment tool with the area of interest, then that treatment tool can treat the probe slice, but all other treatment tools are equivalently moved in the X-direction, preventing simultaneous treatment of multiple probe slices with different X-position areas of interest
Solution Approach 1:
The treatment arm transitions from a static, rigid structure to a dynamic, adjustable configuration. The treatment arm can now be extended or repositioned in the X-direction independently for each treatment tool, allowing each tool to dynamically adapt its X-position to match the area of interest on different probe slices while maintaining parallel processing capability
Data Source
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AI summary
A method for treating a first probe slice (70) and at least a second probe slice (72) by a laboratory automation device (10) is described. The first probe slice (70) is arranged on a first object slide (54) and the second probe slice (72) is arranged on a second object slide (56). The first and second object slides (54, 56) are arranged on an upper surface (51, 53) of a carrier (50, 52), wherein the upper surface (51, 53) of the carrier (50, 52) defines a plane extending in a first direction (40) and in a second direction (42) perpendicular to the first direction (40). The laboratory automation device (10) comprises a handling system (15) having a treatment arm (20) and first and second treatment tool (30, 32) movably arranged at the treatment arm (20). The method comprises: determining positions of a first area of interest (74) of the first probe slice (70) and of a second area of interest (76) of the second probe slice (72) with respect to the first and second directions (40, 42); generating a handling signal and a movement signal depending on the determined positions of the areas of interest (74, 76); sending the handling signal to the handling system (15), wherein the handling signal and the handling system (15) are configured such that upon receiving the handling signal the handling system (15) moves the first object slide (54) in the first direction (40) until the first area of interest (74) overlaps the second area of interest (76) in the first direction (40); sending the movement signal to the handling system (15), wherein the movement signal and the handling system (15) are configured such that upon receiving the movement signal the handling system (15) moves the treatment arm (20) parallel to the first direction (40) until a first treatment spot (80) of the first treatment tool (30) overlaps the first area of interest (74) in the first direction (40) and a second treatment spot (82) of the second treatment tool (32) overlaps the second area of interest (76) in the first direction (40), moves the first treatment tool (30) in a second direction (42) perpendicular to the first direction (40) until the first treatment spot (80) overlaps the first area of interest (74) in the second direction (42), and moves the second treatment tool (32) parallel to the second direction (42) until the second treatment spot (82) overlaps the second area of interest (76) in the second direction (42); and sending a treatment signal to the handling system (15), wherein the treatment signal and the handling system (15) are configured such that upon receiving the treatment signal the handling system (15) treats the first probe slice (70) in the first area of interest (74) by the first treatment tool (30) and the second probe slice (72) in the second area of interest (76) by the second treatment tool (32).