Multi-Wavelength LED Lid Defect Detection System
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Solution Overview
Problem
Existing systems for detecting defects in metallic lids, such as scratches and dings, are inefficient and unreliable, often requiring multiple light wavelengths and increased processing time, which reduces control speed and accuracy.
Innovation Solution
An apparatus that emits radiation beams across a frequency range with incidence angles proportional to their emission frequencies, using a combination of light emitting diodes arranged in specific patterns to illuminate lids with grazing and scattering angles, allowing for simultaneous detection of defects without the need for sequential wavelength activation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple light wavelengths are used sequentially to detect different types of defects, then detection reliability is improved, but processing time increases and control speed decreases
Solution Approach 1:
The patent combines multiple light sources emitting different wavelengths (violet, blue, green, yellow, red LEDs) into a single simultaneous illumination system. This allows the system to detect multiple types of defects (scratches, dings, oxidation) at the same time without sequential activation, thereby maintaining high reliability while improving control speed and productivity.
Solution Approach 2:
The illumination system is designed to perform multiple functions simultaneously by emitting a broad spectrum of wavelengths that can detect various defect types. The single illumination unit serves multiple detection purposes, eliminating the need for separate sequential illumination systems and improving overall system efficiency.
2Reliability
If multiple cameras are used to detect different types of defects, then detection capability is improved, but processing time increases significantly
Solution Approach 1:
The patent merges multiple camera functions into a single camera system that captures images under multi-wavelength illumination simultaneously. This consolidation maintains comprehensive detection capability while significantly reducing processing time compared to using multiple separate cameras that would require coordinated operation and additional processing overhead.
Solution Approach 2:
The patent segments the detection task by wavelength rather than by camera. Different wavelengths are used to highlight different defect types, and a single camera captures all wavelengths simultaneously. This segmentation approach maintains detection capability while avoiding the time penalties of multiple camera systems.
3Measurement precision
If optical filtering means are used to distinguish light wavelengths, then detection precision is improved, but device complexity increases
Solution Approach 1:
The patent applies local quality by using different wavelengths of light to specifically highlight different types of defects in specific areas. Each wavelength is optimized for detecting particular defect characteristics (e.g., scratches, dings, oxidation), providing precise detection without requiring complex filtering mechanisms throughout the entire system.
Solution Approach 2:
The patent changes the parameter of light wavelength to achieve different detection objectives. By varying the wavelength parameter across the spectrum, the system can detect different defect types with high precision. This approach avoids the need for complex optical filtering means while maintaining detection precision through straightforward wavelength selection.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and quick detection of various defects on metallic lids by optimizing lighting angles and frequencies, improving reliability and reducing processing time while avoiding interference between radiation beams.
Implementation Method 1
said lighting means comprise a plurality of light emitting diodes for emission of said radiation beams
Implementation Method 2
light emitting diodes for emission of said radiation beams
Implementation Method 3
each radiation beam emitted by suitable lightening means for lightening a lid to be subjected to examination realises an optical path making an incidence angle with respect to the surface of a lid
Data Source
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AI summary
The present invention relates to an apparatus for detecting defects of elements to be subjected to examination, particularly metallic lids, comprising means (30) for lighting an element to be subjected to examination, an image acquisition unit for acquisition of images, such as a camera or like, able detecting image of said element to be subjected to examination lightened by said lighting means (30), a unit for processing images acquired by said image acquisition unit, suitable to detect said defects, wherein said lighting means (30) emit radiation beams according two or more frequencies (f1, f2, f3) included within a range set beforehand, each one of said radiation beams lighting said element to be subjected to examination according to an optical path, individuating an incidence angle (a) with respect to the surface of said element to be subjected to examination included between a grazing minimum incidence angle and a scattering maximum incidence angle, said lighting means (30) being provided so that incidence angle (a) realized by the optical path of each one of said radiation beams emitted by lighting means (30) is directly proportional or inversely proportional with respect to the relevant emission frequency (f1, f2, f3).