Lithographic Support Table Protrusion Height Adjustment
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Solution Overview
Problem
Lithographic apparatuses face challenges in maintaining a flat substrate support surface due to unevenness caused by protrusions, leading to overlay errors during pattern projection, which existing height adjustment devices do not adequately address.
Innovation Solution
A lithographic projection apparatus equipped with a detector to measure height deviations and a material removing device, such as a mechanical polishing, magneto rheological finishing, or diamond tool, to adjust the height of protrusions while the support table is operable, ensuring surface flatness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If traditional support tables with protrusions are used to support substrates, then the substrate can be held at a defined position, but unevenness in protrusion heights causes surface flatness issues leading to overlay errors
Solution Approach 1:
The patent applies preliminary action by measuring protrusion heights and adjusting them to the correct height before substrate processing begins. The system pre-compensates for height deviations by removing material from protrusions that are too high, ensuring the substrate will be properly supported during lithography operations, thereby preventing overlay errors before they occur.
Solution Approach 2:
The patent replaces manual or traditional mechanical height adjustment methods with an automated material removal system. Instead of mechanically adding material or adjusting protrusions through complex mechanical means, the system uses controlled material removal (e.g., through abrasion or erosion processes) to precisely adjust protrusion heights, achieving better precision and repeatability.
2Manufacturing precision
If height adjustment devices are added to correct protrusion unevenness, then surface flatness can be improved, but device complexity and cost increase
Solution Approach 1:
The patent applies the taking out principle by separating the height adjustment function from the main support table structure. The adjustment mechanism is implemented as a distinct, modular component that can independently modify protrusion heights without affecting the core support table design. This modular approach reduces overall system complexity while achieving the desired surface flatness.
Solution Approach 2:
The system applies self-service by using the support table's own protrusions as the adjustment targets. Rather than introducing an entirely separate adjustment mechanism that acts on the substrate or support surface, the system directly adjusts the protrusions themselves, which are integral to the support table's function. This eliminates the need for additional complex intermediary mechanisms.
3Manufacturing precision
If existing height adjustment methods are used, then some surface unevenness can be corrected, but they cannot adequately address protrusion height deviations in operable support tables
Solution Approach 1:
The patent applies dynamics by creating an adjustable and adaptable height correction system that can be applied to support tables in various states. The material removal mechanism is designed to work with operable support tables, allowing adjustments to be made even when the support table is in use or easily accessible. This dynamic approach enables the system to adapt to different support table configurations and operational requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively adjusts protrusion heights in situ, improving surface flatness and reducing overlay errors, thereby enhancing the quality and cost-effectiveness of the lithographic process.
Implementation Method 1
a magneto rheological finishing tool to adjust the height of the protrusions
Implementation Method 2
a mechanical polishing device to adjust the height of the protrusions
Data Source
AI summary
A lithographic projection apparatus includes a beam production system to provide a beam of radiation, pattern the beam of radiation, and project the patterned beam onto a target portion of a substrate, a support table including protrusions to support an article, a detector to detect height deviations of the protrusions, a material removing device arranged to modify a height of the protrusion material, a controller coupled between the detector and the material removing device, wherein material removing device includes a removal tool selected from the group consisting of a mechanical polishing device, a magneto rheological finishing tool, and a single or multipoint diamond tool.


