Low-Cost SOI Structure Without Wafer Bonding

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Solution Overview

Problem

The high cost of semiconductor-on-insulator (SOI) substrates due to the expensive SOI bonding process hinders the widespread adoption of semiconductor devices that benefit from reduced parasitic capacitance and leakage current.

Innovation Solution

A low-cost SOI structure is formed by depositing a metal layer over an insulating layer, eliminating the need for the expensive bonding process, and incorporating a semiconductor device on this structure to achieve similar performance improvements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the traditional SOI bonding process is used to form semiconductor-on-insulator substrates, then performance advantages such as reduced parasitic capacitance and leakage current are achieved, but fabrication cost increases significantly

Engineering Contradiction:
ImproveperformanceVSAvoidfabrication cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent replaces the expensive traditional SOI bonding process with a cost-effective alternative using deposited metal layers. The metal layer (e.g., tungsten, copper, or aluminum) is deposited over the insulating layer to create a sacrificial structure that is later removed, leaving the desired SOI structure. This approach uses cheaper materials and processes while achieving the same performance benefits of reduced parasitic capacitance and leakage current.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

2Ease of manufacture

If the expensive SOI bonding process is eliminated and replaced with metal layer deposition, then fabrication cost decreases, but structural complexity of the manufacturing process changes

Engineering Contradiction:
Improvefabrication costVSAvoidmanufacturing process complexity
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The patent changes the fundamental parameter of the manufacturing approach by transitioning from a bonding-based process to a deposition-based process. Instead of bonding semiconductor layers to an insulating substrate, the invention deposits metal layers over the insulating layer, then selectively removes portions of the metal layer to form the final SOI structure. This parameter change simplifies the overall manufacturing complexity despite adding deposition steps, as it eliminates the complex bonding process entirely.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The low-cost SOI structure reduces fabrication costs while maintaining performance advantages such as increased switching speed and reduced leakage current, providing a cost-effective alternative to traditional SOI substrates.

Implementation Method 1

A low-cost SOI structure includes a device layer, an insulating layer, and a metal layer. The metal layer is disposed below the device layer and the insulating layer, such that the insulating layer vertically separates the device layer from the metal layer.

Methodology Applied
Scientific EffectPhysical Vapour Deposition: Physical Vapour Deposition

Data Source

PatentUS20250359337A1A low-cost semiconductor-on-insulator (SOI) structure
Publication Date: 2025.11.20 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250359337A1 patent drawing
  • US20250359337A1 patent drawing
  • US20250359337A1 patent drawing

AI summary

Various embodiments of the present disclosure are directed towards an integrated chip (IC). The IC includes a substrate. The substrate includes a metal layer, a device layer disposed over the metal layer, and an insulating layer disposed vertically between the metal layer and the device layer. A semiconductor device is disposed on the device layer. An interlayer dielectric (ILD) layer is disposed over the semiconductor device and the substrate.