Magnetic Element Sidewall Protection via Segmented Etching
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Solution Overview
Problem
Existing methods for manufacturing magnetic random access memory (MRAM) chips using magnetoresistive elements face challenges in minimizing chemical damage to magnetic layers during the etching process, leading to prolonged exposure to etching gases with strong chemical reactions, which affects the fine processing and reliability of the magnetic elements.
Innovation Solution
A manufacturing method involving alternating layers of magnetic and non-magnetic layers, where physical etching is used to expose the top surfaces of magnetic layers, and chemical etching with halogen gases is employed while protecting the sidewalls with re-deposited non-magnetic layers, reducing chemical damage and shortening the exposure time to etching gases.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If chemical etching with halogen gases is used to etch magnetic layers, then etching speed and removal efficiency are improved, but chemical damage to magnetic layers increases and processing reliability deteriorates
Solution Approach 1:
The etching process is divided into two distinct steps: first physical etching with noble gas to create initial openings and protect sidewalls through re-deposition, then chemical etching with halogen gas to complete the etching. This segmentation allows each step to optimize for its specific function, reducing overall chemical damage while maintaining etching efficiency.
Solution Approach 2:
Physical etching with noble gas is performed before chemical etching to pre-create openings and form protective sidewall structures. This preliminary action reduces the subsequent chemical etching time and protects magnetic layers from prolonged chemical exposure, thereby improving reliability while maintaining productivity.
2Manufacturing precision
If prolonged exposure to etching gases is used to ensure complete etching, then etching completeness is improved, but chemical damage to magnetic layers increases
Solution Approach 1:
The etching process is segmented into physical etching first to create openings and sidewall protection, followed by chemical etching to complete the removal. This ensures complete etching through the two-step process while minimizing chemical damage by limiting the duration of chemical gas exposure.
Solution Approach 2:
Noble gas serves as an intermediary in the physical etching step, creating the initial structure and protective sidewalls without causing chemical damage. This intermediary action enables subsequent chemical etching to be faster and more controlled, reducing overall chemical exposure while ensuring completeness.
3Reliability
If physical etching with noble gas is performed first, then sidewall protection and chemical damage reduction are improved, but process time increases
Solution Approach 1:
The etching process is segmented into physical etching with noble gas followed by chemical etching with halogen gas. Although this adds a step, the physical etching creates efficient sidewall protection that enables faster subsequent chemical etching, and the combined process time is optimized to balance protection with overall efficiency.
Solution Approach 2:
The physical etching with noble gas continuously deposits material on sidewalls during the etching process, providing ongoing protection. This continuous protective action prevents chemical damage during the subsequent chemical etching step, maintaining reliability without requiring excessive process time.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables fine processing of magnetoresistive elements with reduced chemical damage, improving the reliability and efficiency of the patterning process by minimizing the contact time of magnetic layers with etching gases, thus maintaining the magnetic and electric characteristics of the elements.
Implementation Method 1
thereafter, the non-magnetic layer is re-deposited on the sidewalls of the magnetic layer
Implementation Method 2
chemical etching with halogen gases is employed while protecting the sidewalls with re-deposited non-magnetic layers
Data Source
AI summary
A magnetic element includes a first magnetic layer, a first non-magnetic layer on the first magnetic layer, a second magnetic layer on the first non-magnetic layer, a second non-magnetic layer on the second magnetic layer, and a third magnetic layer on the second non-magnetic layer, the third magnetic layer having a side wall layer including a material which is included in the second non-magnetic layer; wherein the material is one of Ru and Pt as a common material to the side wall layer and the second non-magnetic layer.


