Magnetic Scanning of Multilayer Specimens Without Radiation
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Solution Overview
Problem
Current methods for analyzing multilayer materials, especially those with chemical functionality or large sizes, face challenges such as the need for destructive testing, radiation exposure, and difficulty in ensuring uniform bonding, which can lead to decreased yield and physical damage.
Innovation Solution
A scanning method and apparatus using magnetism to generate a mixed magnetic field with different frequency signals, allowing for nondestructive analysis of multilayer specimens without radiation or ultrasound, using measurement heads and solenoid coils to detect signals and image results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If nondestructive analysis methods using radioactivity (X-rays) are used, then large specimens and specimens with chemical functionality can be analyzed, but radiation handling becomes difficult and safety issues arise
Solution Approach 1:
The patent replaces electromagnetic radiation-based analysis (X-rays) with a magnetic field-based analysis system. The measurement head generates magnetic fields that penetrate specimens without ionizing radiation, detecting magnetic property variations to image internal structures. This substitution eliminates radiation safety concerns while maintaining nondestructive analysis capability for large and chemically functional specimens.
2Measurement precision
If Transmission Electron Microscope (TEM) is used, then high-resolution analysis is achieved, but the specimen must be dismantled causing physical damage
Solution Approach 1:
The patent replaces the mechanical/electronic beam-based TEM system with a magnetic field-based measurement system. The measurement head scans the specimen surface, detecting magnetic property variations that reveal internal bonding structures. This approach achieves sufficient resolution for bonding uniformity assessment without requiring specimen dismantling or causing physical damage.
3Ease of manufacture
If welding or depositing methods are used to layer metallic plates, then material bonding is achieved, but uniform bonding is difficult to verify
Solution Approach 1:
The patent utilizes the inherent magnetic properties of the bonded materials themselves for verification. The measurement head detects magnetic property variations at the bonding interface, allowing the material's own magnetic characteristics to serve as the verification mechanism. This self-service approach provides direct, nondestructive verification of bonding uniformity without requiring additional testing equipment or specimen destruction.
4Measurement precision
If expensive electron microscopes are used for material analysis, then detailed material structure can be observed, but the cost becomes prohibitively high
Solution Approach 1:
The patent employs a relatively simple measurement head with solenoid coils and detection coils instead of expensive electron microscopes. The system uses affordable magnetic field generation and detection components to achieve practical resolution for bonding verification. This approach provides cost-effective material analysis sufficient for industrial quality control without the prohibitive costs of high-end electron microscopy equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables nondestructive analysis of multilayer specimens of any size, including those with chemical functionality, without physical damage or the use of expensive electron microscopes, while ensuring uniform bonding assessment.
Implementation Method 1
exciting a mixed magnetic field on a multilayer specimen using at least one excitation solenoid coil
Implementation Method 2
detecting detection signals from the multilayer specimen using a detection solenoid coil
Data Source
AI summary
Disclosed herein are a method and apparatus for scanning a multilayer material using magnetism. The apparatus for scanning a multilayer material includes at least one measurement head for exciting a mixed magnetic field on a multilayer specimen using at least one excitation solenoid coil and detecting detection signals from the multilayer specimen using a detection solenoid coil, a movement controller for moving any one of the at least one measurement head and a stage on which the multilayer specimen is placed in order to detect detection signals for all parts of the multilayer specimen, and a signal controller for generating two excitation signals having different frequencies in order to generate the mixed magnetic field and for generating a scanning result for the multilayer specimen by collecting the detection signals.