Magnetism Detection Device Using Common Stacked Structures
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Solution Overview
Problem
Existing magnetism detection devices face challenges in productivity due to complex manufacturing processes and the need for improved structural simplicity.
Innovation Solution
A magnetism detection device is designed with a sensor section and resistive section, featuring stacked structures for both magnetism detection elements and resistive elements, allowing for simpler manufacturing processes by using common materials and stacking orders, and incorporating dummy patterns to minimize film quality dispersion and reduce overall dimensions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If different structures are used for magnetism detection elements and resistive elements, then detection functionality is improved, but manufacturing complexity increases
Solution Approach 1:
The patent applies universality by using the same stacked structure for both magnetism detection elements and resistive elements. This allows a single manufacturing process to produce both functional types of elements, reducing manufacturing complexity while maintaining detection functionality through the magnetism detection elements' specific configuration
Solution Approach 2:
The patent segments the device into sensor sections (with magnetism detection elements) and resistive sections (with resistive elements), each having identical stacked structures. This segmentation allows independent optimization of regions while using common manufacturing processes, resolving the contradiction between functional specialization and manufacturing simplicity
2Manufacturing precision
If complex manufacturing processes are used, then manufacturing precision is improved, but productivity decreases
Solution Approach 1:
The patent merges the manufacturing processes for magnetism detection elements and resistive elements into a single stacked structure fabrication process. This combining of processes maintains manufacturing precision through standardized procedures while significantly improving productivity by eliminating separate manufacturing steps
Solution Approach 2:
The patent employs homogeneity by using identical stacked structures for both element types, allowing uniform manufacturing conditions and processes to be applied across all elements. This homogeneous approach ensures consistent manufacturing precision while enabling high-volume production through streamlined processes
3Ease of operation
If larger dimensions are used, then assembly ease is improved, but device size increases
Solution Approach 1:
The patent applies the nested doll principle by integrating resistive elements and magnetism detection elements within the same stacked structure layers. This nesting allows compact arrangement of components while maintaining sufficient spacing for assembly, achieving miniaturization without sacrificing assembly ease
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device achieves enhanced manufacturing efficiency and improved detection accuracy by utilizing common stacked structures and dummy patterns, enabling easier assembly and miniaturization.
Implementation Method 1
The first magnetic body has first magnetization pinned in a first direction and is configured to detect a magnetic field to be detected
Implementation Method 2
Japanese Unexamined Patent Application Publication No. 2011-33456 describes a magnetic sensor provided with a circuit in which a plurality of magneto-resistive effect elements are coupled in series
Data Source
AI summary
A magnetism detection device according to an embodiment of the disclosure includes a sensor section and a resistive section. The sensor section includes a first magnetism detection element. The first magnetism detection element has a first stacked structure and is configured to detect a magnetic field to be detected. The resistive section includes a first resistive element and is coupled to the sensor section. The first resistive element has the first stacked structure.