Microcontroller State Machine for Pre-Boot Self-Test

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Solution Overview

Problem

Software-based debugger and self-test operations in integrated circuits (ICs) are prone to errors, which can compromise the reliability of ICs, especially in critical applications like infotainment and industrial systems.

Innovation Solution

Incorporating a state machine within the microcontroller and wakeup circuitry to perform pre-boot self-test operations, ensuring the correct functionality of MCU and wakeup circuitry components without relying on the SoC, and allowing the SoC to boot in either normal or safe mode based on the self-test results.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If software-based debugger and self-test operations are used in ICs, then the ability to perform debugging and testing is improved, but the reliability deteriorates due to errors in IC hardware

Engineering Contradiction:
Improvedebugger and self-test operationsVSAvoidIC hardware reliability
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent introduces a state machine as an intermediary component that performs self-test operations independently of the processor core and software. This state machine is implemented in hardware but operates autonomously to test microcontroller components, thereby avoiding the reliability issues associated with software-based testing while maintaining the ability to perform comprehensive self-tests.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the software-based debugger and self-test system with a hardware-based state machine. This substitution eliminates the dependency on software execution and processor functionality, providing a more reliable testing mechanism that operates directly in hardware to assess the integrity of microcontroller components.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If a state machine is added to perform pre-boot self-tests, then the reliability is improved, but the device complexity increases

Engineering Contradiction:
ImproveIC reliabilityVSAvoidmicrocontroller structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the state machine functionality directly into the microcontroller structure, integrating the self-test capabilities with the existing microcontroller components. This integration approach allows the state machine to share resources and logic with the microcontroller, thereby reducing the overall complexity increase that would result from adding a completely separate testing system.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If self-test operations are performed before boot operations, then the reliability is improved, but the boot time increases

Engineering Contradiction:
Improveboot process reliabilityVSAvoidboot time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent performs self-test operations as a preliminary action during the power-up sequence, before the processor core executes boot operations. By completing the critical self-tests of microcontroller components early in the initialization process, the system ensures reliability while allowing the subsequent boot operations to proceed efficiently without repeated testing delays.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12158836B2Integrated circuit with state machine for pre-boot self-tests
Publication Date: 2024.12.03 TEXAS INSTRUMENTS INC
  • US12158836B2 patent drawing
  • US12158836B2 patent drawing
  • US12158836B2 patent drawing

AI summary

An integrated circuit includes a processor core configured to perform boot operations; and a microcontroller coupled to a processor core. The microcontroller includes: a set of microcontroller components; and a state machine coupled to the set of microcontroller components. The state machine is configured to perform self-test operations on the set of microcontroller components before the boot operations.