Memory Block Testing via Page-Level Programming Time Compensation

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Solution Overview

Problem

Conventional memory block testing methods fail entire blocks if a single page exceeds a predetermined programming time, leading to increased manufacturing times and reduced yields due to over-reliance on fabrication process variations.

Innovation Solution

A test method that evaluates programming speed by allowing blocks to pass if a majority of pages meet predetermined programming times, with slower pages compensated by faster ones, rather than failing the entire block for a single slow page.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional test methods determine programming time for each page and fail the entire block if any one page exceeds predetermined time, then programming speed guarantee is improved, but manufacturing yield deteriorates due to unnecessary block failures

Engineering Contradiction:
Improveprogramming speed guaranteeVSAvoidmanufacturing yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent segments the block evaluation into individual page performance assessments. Instead of treating the block as a single unit where one slow page fails the entire block, the method evaluates each page's programming time independently and allows the block to pass if the majority of pages meet the speed requirement, with slower pages compensated by faster ones.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the evaluation parameter from binary (pass/fail based on any single page) to a distributed assessment where programming times of multiple pages are compared and averaged. This parameter transformation allows compensation between fast and slow pages, reducing unnecessary block failures while maintaining programming speed guarantees.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If entire blocks are failed and repaired due to single slow pages, then programming speed control is improved, but manufacturing time increases

Engineering Contradiction:
Improveprogramming speed controlVSAvoidmanufacturing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the block into individual pages for independent timing evaluation. By assessing each page's programming time separately and allowing compensation between pages, the method avoids time-consuming repairs of entire blocks that would otherwise be failed due to single slow pages.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transforms the evaluation from a strict per-page threshold check to a comparative assessment where pages are evaluated relative to each other. This parameter change enables blocks with some slow pages to pass if compensated by faster pages, eliminating unnecessary repair cycles and reducing manufacturing time.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If strict per-page programming time limits are applied, then quality control is improved, but device complexity increases due to frequent repairs

Engineering Contradiction:
Improvequality controlVSAvoidrepair frequency
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent changes the quality control parameter from individual page threshold enforcement to a block-level statistical assessment. By evaluating whether the majority of pages meet timing requirements and allowing compensation, the method maintains quality control while reducing the complexity associated with frequent block repairs.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent merges individual page performance evaluations into a unified block assessment. Instead of treating each page independently with strict pass/fail criteria, the method combines page timings into an overall block evaluation, reducing repair frequency and associated complexity.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS8094508B2Memory block testing
Publication Date: 2012.01.10 MICRON TECHNOLOGY INC
  • US8094508B2 patent drawing
  • US8094508B2 patent drawing
  • US8094508B2 patent drawing

AI summary

A memory block of a memory device is tested by programming a plurality of pages of the memory block, passing the memory block if a number of pages, each programmed in a first programming time, is greater than or equal to a first predetermined number and a number of pages, each programmed in a second programming time, is less than or equal to a second predetermined number, and failing the memory block if a programming time of any one of the pages exceeds a predetermined programming time or if the number of pages programmed in the first programming time is less than the first predetermined number or if the number of pages programmed in the second programming time exceeds the second predetermined number.