Semiconductor Memory Block Uniformity via Position-Dependent Control
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Solution Overview
Problem
Semiconductor devices with memory blocks face challenges in achieving uniform electrical characteristics due to varying characteristics across different memory blocks, leading to inconsistent operating conditions and reduced operational reliability.
Innovation Solution
A semiconductor device with a memory array and operation circuit that adjusts program and erase loop operations based on the difference between the cell current value of a selected memory block and a reference cell current value, controlling threshold voltages and verify operations to ensure uniformity across memory blocks.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If memory blocks are arranged in line with varying characteristics, then device complexity is reduced, but electrical characteristics become non-uniform
Solution Approach 1:
The patent applies local quality by setting different operating conditions for different memory blocks based on their position. Specifically, memory blocks are divided into first memory blocks and second memory blocks, with different program/erase voltages or different numbers of program/erase loops applied to each group, compensating for position-dependent characteristic variations and achieving uniform electrical characteristics across all blocks.
2Ease of operation
If operating conditions are set uniformly for all memory blocks, then ease of operation is improved, but electrical characteristics become inconsistent
Solution Approach 1:
The patent implements local quality by establishing position-dependent operating conditions. The controller identifies whether each memory block belongs to the first or second group based on its position, and applies tailored program/erase voltages or loop counts to each group, ensuring consistent electrical characteristics while maintaining automated operation through position-based classification.
Solution Approach 2:
The patent applies parameter changes by modifying operating parameters (program voltage, erase voltage, or number of loops) based on memory block position. This allows the system to adapt operating conditions to compensate for physical variations, achieving uniform electrical characteristics across different block positions without manual intervention.
3Reliability
If position-dependent operating conditions are applied, then electrical characteristics uniformity is improved, but device complexity increases
Solution Approach 1:
The patent applies segmentation by dividing memory blocks into distinct groups (first memory blocks and second memory blocks) based on their positions. This segmentation simplifies the control logic by creating discrete categories with predefined operating conditions, making the position-dependent control more manageable while still achieving uniform electrical characteristics across all blocks.
Data Source
AI summary
A semiconductor device includes a memory array including memory blocks; and an operation circuit suitable for performing a program loop and an erase loop on memory cells and selection transistors included in a selected memory block, wherein the program loop is performed by controlling a target threshold voltage value of the selection transistors based on a difference between a cell current value of the selected memory block and a reference cell current value.