Memory Charge Pump Configuration for Current Drop Noise Reduction
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Solution Overview
Problem
Memory devices employ a conservative number of charge pumps based on worst-case scenarios, leading to increased noise and reduced performance due to excessive charge pump interference, as the number of charge pumps is often larger than needed for average operations.
Innovation Solution
Implementing a method to adjust the number of active charge pumps in memory devices through testing and programmable fuse circuitry, allowing for optimal configuration based on performance verification, reducing noise and improving yield by enabling or disabling charge pumps as necessary.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conservative number of charge pumps is used based on worst-case scenarios, then reliability is improved, but noise increases and performance deteriorates
Solution Approach 1:
The patent implements dynamic charge pump configuration where the number of active charge pumps is adjusted based on actual operational needs rather than using a fixed conservative number. Testing circuitry determines the minimum required charge pumps, and fuse circuitry permanently disables excess charge pumps, transforming the static system into a dynamic one that adapts to actual requirements and reduces noise from unnecessary charge pump activity.
2Reliability
If more charge pumps are used to meet worst-case performance requirements, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent segments the charge pump array into individually controllable units with associated enable circuitry. Each charge pump can be independently enabled or disabled through fuse circuitry based on testing results. This segmentation allows the system to activate only the necessary number of charge pumps for each device, reducing overall complexity while maintaining reliability requirements.
3Power
If all charge pumps are enabled to ensure sufficient voltage supply, then power delivery is improved, but current drop noise increases
Solution Approach 1:
The patent extracts and removes excess charge pumps from active service by permanently disabling them through fuse circuitry after testing determines the minimum required number. This extraction eliminates the noise-generating activity of unnecessary charge pumps while retaining sufficient power delivery capability from the remaining active charge pumps to meet all operational requirements.
Data Source
AI summary
Memory devices may have internal circuitry that employs voltages higher and/or lower than voltages provided by an external power source. Charge pumps are DC/DC converters that may be used to generate the higher voltages internally. The number of available charge pumps in a memory device may be conservatively dimensioned to be high, in some systems to protect yields. Some of the available charge pumps may be disabled during manufacturing or testing to reduce the number of active charge pumps. The testing process may employ dedicated logic in the memory device and the disabling may employ fuse circuitry.