Memory Clock Generation Using Variable Delay to Reduce EMI

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Solution Overview

Problem

Semiconductor memory devices face increasing electro-magnetic interference (EMI) as they operate faster and occupy smaller areas, leading to potential circuit malfunctions due to short internal lines acting as antennas for internal clock signals, necessitating a solution to mitigate this interference.

Innovation Solution

A semiconductor memory device that modulates its internal clock signal based on operation frequency using a control voltage generation circuit and a voltage-controlled delay line to generate synchronization clock signals, reducing EMI by varying the clock signal frequency and synchronizing data output accordingly.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the semiconductor memory device operates at higher speeds with shorter internal lines, then productivity and integration density are improved, but electro-magnetic interference increases causing circuit malfunction

Engineering Contradiction:
Improveoperation speedVSAvoidelectro-magnetic interference
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The patent applies dynamics by making the internal clock signal frequency variable rather than fixed. The clock generation circuit dynamically adjusts the frequency of internal clock signals based on operating conditions, transforming the static clock system into a dynamic one that can adapt to reduce EMI while maintaining high-speed operation requirements

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the frequency parameter of the internal clock signal to resolve the EMI issue. By varying the clock frequency, the wavelength changes, preventing the internal lines from functioning as efficient antennas. This parameter change allows the system to maintain high-speed operation while reducing electromagnetic radiation through frequency modulation

Inventive Principle:
Principle #35Parameter changes

2Object-generated harmful factors

If the internal clock signal frequency is modulated to reduce EMI, then electro-magnetic interference decreases, but clock signal stability and synchronization may be affected

Engineering Contradiction:
Improveelectro-magnetic interferenceVSAvoidclock signal stability
Core Design Contradiction:
Object-generated harmful factorsVSReliability

Solution Approach 1:

The patent employs periodic action through controlled frequency modulation of the internal clock signal. The clock frequency is varied in a periodic manner that corresponds to data operation patterns, creating synchronized modulation that reduces EMI during critical periods while maintaining operational stability through structured, predictable frequency changes

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent implements feedback mechanisms in the clock generation circuit that monitor operating conditions and adjust the internal clock frequency accordingly. This feedback control ensures that frequency modulation occurs in a controlled manner that reduces EMI while maintaining the necessary clock signal stability and synchronization for reliable memory operation

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively decreases electro-magnetic interference both within and outside the semiconductor memory device by dynamically adjusting the internal clock signal frequency, preventing malfunctions and ensuring reliable operation at high frequencies.

Implementation Method 1

a voltage controlled delay line configured to generate an internal clock signal by delaying a reference clock signal by a time corresponding to the control voltage

Methodology Applied
Scientific EffectVoltage-controlled delay:

Data Source

PatentUS20130163367A1Clock generation circuit and semiconductor memory device employing the same
Publication Date: 2013.06.27 MIMIRIP LLC
  • US20130163367A1 patent drawing
  • US20130163367A1 patent drawing
  • US20130163367A1 patent drawing

AI summary

A semiconductor memory device includes a first internal clock generation circuit configured to generate a first internal clock by compensating an external clock signal for a transfer delay thereof in the semiconductor memory device, a control voltage generation circuit configured to generate a control voltage in response to a profile selection signal, a second internal clock generation circuit configured to generate a second internal clock signal by delaying the first internal clock signal by a time corresponding to the control voltage, a selection output circuit configured to select one of the first internal clock signal and the second internal clock signal in response to a path selection signal and output a selected signal as a synchronization clock signal, and a data output circuit configured to output a data in synchronization with the synchronization clock signal.