Memory Controller Tag Cache for Defect Detection
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Solution Overview
Problem
Traditional memory defect detection methods in memory systems often cause memory stress, leading to increased vulnerability and reduced yield, as they require harsh testing to reveal defects.
Innovation Solution
A system and method utilizing a Flash Management Unit Tag cache and data keep caches to store and update XOR sums during data writes, enabling defect detection and data recovery within memory systems, thereby reducing the need for harsh testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If harsh stress testing is applied to detect memory defects, then defect detection capability is improved, but memory yield decreases due to increased vulnerability and additional failures
Solution Approach 1:
The system performs preliminary defect detection during normal write operations by storing XOR sums in data keep caches before actual writes occur. This allows defects to be detected under normal operating conditions rather than requiring harsh stress testing, thereby maintaining memory yield while still achieving defect detection.
Solution Approach 2:
The patent introduces XOR sums as an intermediary mechanism to detect memory defects. Instead of directly stressing the memory to reveal defects, the system uses XOR operations on cached data to indirectly detect defects during normal operation, reducing the need for harsh testing and preserving memory yield.
2Productivity
If normal write operations are performed without stress testing, then memory yield is maintained, but defect detection capability is reduced
Solution Approach 1:
The system implements a feedback mechanism where XOR sums are continuously updated and stored in data keep caches during normal write operations. This feedback loop allows the system to detect defects under normal operating conditions, maintaining memory yield while preserving defect detection capability through continuous monitoring of write operations.
Solution Approach 2:
The memory system performs self-diagnosis during normal write operations by using XOR operations on cached data to detect defects. This self-service approach eliminates the need for separate stress testing phases, allowing defect detection to occur organically during regular operation and maintaining high memory yield.
Data Source
AI summary
Systems and methods for performing defect detection and data recovery within a memory system are disclosed. A controller of a memory system may receive a command to write data in a memory of the memory system; determine a physical location of the memory that is associated with the data write; write data associated with the data write to the physical location; and store the physical location of the memory that is associated with the data write in a Tag cache. The controller may further identify a data keep cache of a plurality of data keep caches that is associated with the data write based on the physical location of the memory that is associated with the data write; update an XOR sum based on the data of the data write; and store the updated XOR sum in the identified data keep cache.