Radiation-Tolerant Memory Correction Using Retained Output State
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Solution Overview
Problem
Existing memory apparatuses are vulnerable to radiation errors due to cosmic or ionizing radiation, leading to data corruption and malfunctions, which current technologies fail to effectively correct, especially when more than half of the memory elements are affected.
Innovation Solution
A memory element arrangement comprising at least three memory elements and an error correction circuit that outputs the same value when all elements match, and retains a previous output when they provide different values, allowing for correction of errors affecting up to n−1 memory elements by using an n-input correction element with logic gates or transistors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If standard memory elements are used without error correction, then device complexity is low, but reliability deteriorates due to radiation errors
Solution Approach 1:
The memory system is segmented into multiple independent memory elements (at least three) that store the same data value independently. This segmentation allows individual elements to be affected by radiation errors without compromising the entire memory system, as other elements can provide correct values for error correction.
Solution Approach 2:
An error correction circuit is introduced as an intermediary component between the memory elements and the data output. This circuit receives values from multiple memory elements, performs error detection and correction logic, and outputs the corrected data value, thereby protecting against radiation errors without requiring changes to the fundamental memory element structure.
2Reliability
If majority decision-making is used for error correction, then reliability improves, but device complexity increases
Solution Approach 1:
The error correction circuit changes its operational parameters (output value) based on the input conditions from memory elements. When all memory elements output the same value, the circuit outputs this value directly. When there are discrepancies indicating errors, the circuit retains the previously correct output value, effectively adapting its behavior to correct errors without requiring complex real-time majority voting logic.
3Reliability
If multiple memory elements are used for redundancy, then reliability improves, but loss of information increases due to more elements potentially being affected
Solution Approach 1:
The error correction circuit implements a feedback mechanism where it continuously monitors the outputs of multiple memory elements and compares them against each other and against previously output values. This feedback allows the system to detect when radiation errors have occurred and to correct them by retaining the last known good value, preventing data corruption even when multiple elements are affected.
Data Source
AI summary
Methods and apparatuses relating to error-tolerant memories are provided. In one example embodiment, output signals from at least three memory devices are supplied to an error correction device. The error correction device outputs a corrected data value in such a manner that, when the read data values match, this data value is output and, in at least one state in which the data values do not match, a previously output data value is retained.