Memory Cell Corrective Reads for Data Retention Recovery

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Solution Overview

Problem

Memory devices experience RWB degradation due to cell-to-cell interference and intrinsic charge loss, leading to increased bit errors and error rates, which are exacerbated by corrective read operations that require a large number of reads, impacting performance and reliability.

Innovation Solution

Implement corrective reads with improved recovery by assigning target cells to bins using a pre-defined operation on the cell state information of adjacent cells, such as a linear combination of their threshold voltages, reducing the number of reads needed and minimizing read disturb effects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If corrective read operations are performed to recover from data retention loss, then reliability is improved, but productivity deteriorates due to the large number of reads required

Engineering Contradiction:
ImprovereliabilityVSAvoidproductivity
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent segments the corrective read process by dividing target cells into different bins based on the states of their adjacent cells. This segmentation allows the system to apply different read strategies to different groups of cells, reducing the overall number of reads needed while maintaining reliability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies partial action by performing reads only on necessary target cells based on adjacent cell states. Instead of reading all target cells uniformly, the system selectively reads only those cells that require correction, reducing the total number of reads while maintaining reliability.

Inventive Principle:
Principle #16Partial or excessive action

2Reliability

If corrective read operations are performed to improve recovery from data retention loss, then reliability is improved, but loss of time increases due to the large number of reads

Engineering Contradiction:
ImprovereliabilityVSAvoidloss of time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent performs preliminary action by determining the states of adjacent cells before performing corrective reads on target cells. This preliminary assessment allows the system to identify which target cells actually need correction, avoiding unnecessary reads and reducing time loss.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system performs only the necessary reads based on adjacent cell states, avoiding excessive reads on cells that don't require correction. This partial action approach reduces the total time required for corrective read operations.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If a large number of reads are performed during corrective read operations, then reliability is improved through better recovery, but read disturb effects increase impacting performance

Engineering Contradiction:
ImprovereliabilityVSAvoidread disturb effects
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent applies partial action by performing reads only on target cells that actually need correction based on adjacent cell states. This reduces the total number of reads and consequently minimizes read disturb effects on other cells while maintaining reliability.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The patent converts the potential harm of read disturb effects into a benefit by using adjacent cell states to identify and correct only the necessary target cells. This selective approach ensures that read operations are performed only where needed, transforming what could be harmful excessive reads into beneficial targeted corrections.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Data Source

PatentUS20250349348A1Corrective reads with improved recovery from data retention loss
Publication Date: 2025.11.13 MICRON TECHNOLOGY INC
  • US20250349348A1 patent drawing
  • US20250349348A1 patent drawing
  • US20250349348A1 patent drawing

AI summary

A memory device can include a memory array and control logic, operatively coupled with the memory array, to perform operations including identifying a first base state information bin associated with a first index value and a second base state information bin associated with a second index value, determining a third index value based on the first index value and the second index value, assigning a target cell of the memory array to a target cell state information bin associated with the third index value, and causing the target cell, assigned to the target cell state information bin, to be read.