Memory Device Autonomous Data Restoration Circuit
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Solution Overview
Problem
Nonvolatile memory devices face reliability issues due to changes in threshold voltages over time, leading to data degradation and uncorrectable errors, which affect the accuracy of read data and require external intervention for error correction.
Innovation Solution
A memory device with a counting circuit and control logic that performs data restoration operations independently, without involving a memory controller, by identifying degraded cells and executing restoration algorithms based on counting results, thereby maintaining data integrity and reducing the need for external error correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If data restoration operation is performed without involvement of memory controller, then device complexity is reduced and operation speed is improved, but reliability requirement increases as the memory device must autonomously handle uncorrectable errors
Solution Approach 1:
The memory device performs data restoration operations autonomously without memory controller involvement. The control logic detects uncorrectable errors and executes restoration algorithms using the counting circuit to identify degraded cells, enabling the system to serve itself and eliminate external intervention for error recovery.
Solution Approach 2:
The memory device is divided into functional components: counting circuit for identifying degraded cells, error detection logic for detecting uncorrectable errors, and control logic for executing restoration operations. This segmentation allows autonomous operation while maintaining reliability through specialized error handling capabilities.
2Ease of operation
If counting circuit and control logic are integrated into memory device, then ease of operation is improved by reducing external intervention, but device complexity increases due to additional internal components
Solution Approach 1:
The counting circuit, error detection logic, and control logic are merged into the memory device structure. This integration enables autonomous operation where the memory device independently performs error detection and restoration without external memory controller involvement, simplifying the overall system operation.
Solution Approach 2:
The control logic serves multiple functions: normal memory operations, error detection, and data restoration. This multi-functionality reduces the need for separate dedicated error handling components, balancing autonomous capability with acceptable device complexity.
3Loss of time
If data restoration is performed autonomously in memory device, then loss of time is reduced by eliminating controller intervention, but manufacturing precision requirement increases to ensure reliable autonomous error detection and restoration
Solution Approach 1:
The counting circuit continuously monitors and counts degraded cells in advance. When uncorrectable errors are detected, the restoration operation is immediately initiated using pre-identified cell information, eliminating the time delay that would occur with external controller intervention and reducing error recovery time.
Data Source
AI summary
A memory device includes a memory cell array including a plurality of memory cells; a counting circuit configured to obtain a counting result by performing a counting operation on data read from the plurality of memory cells; and a control logic configured to perform a data restoring operation based on the counting result without involvement of a memory controller.