Memory Device Thermometer Circuit Temperature Detection
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Solution Overview
Problem
Memory devices struggle to accurately detect out-of-range operating temperatures due to instability in internal voltage supplies, leading to incorrect temperature measurements and potential data corruption, especially in varying environmental conditions.
Innovation Solution
A memory device with multiple thermometer circuits, including both internally and externally powered thermometers, generates a flag signal when the operating temperature exceeds acceptable thresholds, providing a redundant system to alert the host system of out-of-range temperatures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If internally powered thermometers are used to detect operating temperature, then the detection system is simple, but the temperature measurement becomes inaccurate under varying voltage conditions
Solution Approach 1:
The patent introduces an external voltage source as an intermediary to power the thermometer circuit, separating the temperature sensing function from the unstable internal voltage supply. This external power source acts as a mediator that provides stable operating voltage to the thermometer, enabling accurate temperature measurements without being affected by variations in the memory device's internal voltage.
Solution Approach 2:
The patent creates a redundant temperature detection system by using multiple thermometer circuits - one powered by the internal voltage and another by the external voltage source. This copying approach allows the system to compare readings and identify which thermometer provides accurate measurements under current operating conditions, thereby ensuring reliable temperature detection.
2Measurement precision
If multiple thermometer circuits with different power sources are used, then temperature detection accuracy is improved, but device complexity increases
Solution Approach 1:
The patent implements multiple thermometer circuits but does not require both to operate simultaneously under all conditions. The system can selectively use the external voltage-powered thermometer when voltage stability is an issue, or rely on the internal thermometer when conditions are favorable. This partial action approach provides measurement accuracy benefits without requiring full complexity to be active at all times.
3Device complexity
If the memory device operates without temperature monitoring, then the device is simpler, but data corruption risk increases under out-of-range temperatures
Solution Approach 1:
The patent implements a feedback mechanism where the thermometer circuit continuously monitors temperature and provides information to the memory device's control logic. When the temperature exceeds acceptable ranges, the system receives feedback about the out-of-range condition and can take corrective actions such as reducing operating frequency, enabling error correction, or shutting down operations to prevent data corruption.
Solution Approach 2:
The temperature monitoring system detects out-of-range conditions before they cause data corruption. By providing advance warning of temperature issues, the system allows preventive measures to be taken - such as adjusting operating parameters or activating protection mechanisms - before actual data integrity problems occur.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Ensures accurate detection of out-of-range temperatures, preventing data corruption by generating a flag signal that allows the host system to take corrective actions, such as terminating operations or switching to a redundant memory system.
Implementation Method 1
a first thermometer circuit powered by an internal voltage supply and a second thermometer circuit powered by an external voltage supply to detect an operating temperature of a memory die
Data Source
AI summary
A memory device including a memory die including an internally-powered thermometer to determine a first measured operating temperature value of the memory die; detect the first measured operating temperature value satisfies one of a first condition or a second condition; and generate a first signal indicating an out-of-range operating temperature of the memory die in response to one of the first condition or the second condition being satisfied by the first measured operating temperature value. The memory die also including an externally-powered thermometer to: determine a second measured operating temperature value of the memory die; detect the second measured operating temperature value satisfies one of the first condition or the second condition; and generate a second signal indicating the out-of-range operating temperature of the memory die in response to one of the first condition or the second condition being satisfied by the second measured operating temperature value.