Memory Duty-Cycle Skew Management for Degradation Compensation

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Solution Overview

Problem

Memory devices degrade over time due to transistor aging, leading to performance and reliability issues, with conventional memory controller settings being insufficient to compensate for these degradations, resulting in read and write errors and eventual device failure.

Innovation Solution

A memory sub-system that allows the memory controller to modify periodic signals by changing their duty cycle and phase, enabling the identification of optimum settings to minimize data access errors and detect degradation, with the ability to reconfigure the memory sub-system to reduce degradation rates and prevent failure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional memory controller settings are used, then the memory sub-system operates normally initially, but degradation leads to read and write errors and device failure over time

Engineering Contradiction:
Improvememory device reliabilityVSAvoidmemory device lifespan
Core Design Contradiction:
ReliabilityVSDuration of action of stationary object

Solution Approach 1:

The patent applies dynamics by making the memory controller settings adjustable and adaptive over time. The system dynamically modifies periodic signal parameters (duty cycle, phase) based on detected degradation levels, transitioning from static conventional settings to dynamic adaptive settings that evolve with the memory device's aging process

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent implements parameter changes by modifying physical parameters of periodic signals (duty cycle, phase shift) to compensate for degradation. The memory controller adjusts these parameters based on measured error rates and degradation indicators, changing the signal characteristics to maintain reliable operation as the device ages

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the memory controller modifies periodic signals by changing duty cycle and phase, then data access errors are minimized and degradation is detected, but the system complexity increases

Engineering Contradiction:
Improvedata access reliabilityVSAvoidmemory controller complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies feedback by implementing a closed-loop system where the memory controller measures error rates and degradation indicators, then uses this information to adjust periodic signal parameters. The feedback mechanism continuously monitors performance and automatically modifies settings to maintain optimal operation, reducing the need for complex external intervention

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent implements self-service by enabling the memory controller to automatically detect its own degradation and self-correct by adjusting its internal signal parameters. The system monitors its own health metrics and performs self-optimization without requiring external diagnostic tools or manual reconfiguration

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11651834B2Memory duty-cycle skew management
Publication Date: 2023.05.16 MICRON TECHNOLOGY INC
  • US11651834B2 patent drawing
  • US11651834B2 patent drawing
  • US11651834B2 patent drawing

AI summary

A system and method for optimizing a memory sub-system to compensate for memory device degradation. An example system including a memory controller operatively coupled with a memory device and configured to perform operations comprising: updating a setting of the memory device, wherein the setting changes a duty cycle of a signal of the memory device and comprises a first value for a first configuration and comprises a second value for a second configuration; storing error data that indicates errors when using the first configuration and errors when using the second configuration; determining a value for the setting based on the error data, wherein the determined value minimizes errors associated with the memory device; and storing the determined value for the setting of the memory device.