Memory Device Real-Time Error Log Dump Trigger
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Solution Overview
Problem
Current memory systems face challenges in capturing critical information in real-time during product debugging due to synchronization difficulties between hosts and memory devices, leading to inefficient and time-consuming failure analysis, especially when link losses occur, causing missed notifications and missed opportunities to update error logs.
Innovation Solution
A real-time trigger mechanism is implemented to notify memory devices to dump error logs promptly, using a dedicated non-volatile memory and timing circuitry to differentiate trigger signals from functional signals, allowing for timely capture and saving of error information associated with conditions like data timeouts and firmware stuck states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If a real-time trigger mechanism is implemented to notify memory devices to dump error logs promptly, then the timeliness of error log capture is improved, but the device complexity increases due to additional timing circuitry and signal differentiation mechanisms
Solution Approach 1:
The patent segments the signal processing function by separating trigger signal detection from functional signal processing. The timing circuitry independently monitors for trigger signals while the memory device continues normal operations, allowing error log dumping to be initiated separately from regular memory operations without interfering with each other
Solution Approach 2:
The patent introduces timing circuitry as an intermediary component that mediates between the host trigger signal and the memory device's error log dumping operation. This intermediary detects the trigger signal, validates its timing characteristics, and initiates the error log dump sequence, isolating the complexity of signal differentiation from the main memory operations
2Measurement precision
If timing circuitry is added to differentiate trigger signals from functional signals, then the precision of error condition detection is improved, but the device complexity increases
Solution Approach 1:
The patent applies local quality by giving specific timing characteristics only to the trigger signal rather than requiring all signals to have complex timing validation. The timing circuitry checks for specific timing patterns (such as multiple consecutive cycles or specific pulse widths) that distinguish trigger signals from normal functional signals, applying precise measurement only where needed for trigger detection
3Reliability
If error logs are dumped to non-volatile memory in real-time, then the reliability of error information preservation is improved, but the productivity of memory operations decreases due to additional write operations
Solution Approach 1:
The patent implements preliminary action by maintaining an error log buffer in volatile memory that continuously captures error information as it occurs. When a trigger signal is received, the pre-captured error log data is then dumped to non-volatile memory. This approach ensures error information is preserved reliably while separating the continuous error capture function from the periodic dump operation, minimizing impact on memory throughput
Data Source
AI summary
In various embodiments, a technique can be provided to address debug efficiency for failures found on an operational system. The approach can make use of an existing pin on a memory device with added logic to respond to a trigger signal structured different from a signal that is normally sent to the existing pin on the memory device such that the memory device performs a normal or routine function of the memory device in response to the signal. In response to detecting one or more error conditions associated with the memory device, a system that interfaces with the memory device can generate the trigger signal to the memory device. In response to receiving the trigger signal, the memory device can dump an error log of the memory device to a memory component in the memory device. The error log can later be retrieved from the memory component for failure analysis.