Holdup Self-Tests for Memory Power Loss Defect Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional memory systems are unable to accurately verify if they have sufficient power to complete expected operations during power loss events and cannot detect defects in secondary power sources, leading to unnecessary energy storage and potential system compromise.
Innovation Solution
A holdup self-test method that estimates the number of operations a memory system can complete with a given holdup design, detects defects in secondary power sources, and reports any deficiencies, allowing for improved energy management and reduced unnecessary energy storage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional memory systems use secondary power sources for power loss operations, then system reliability during power loss is improved, but the ability to detect defects in secondary power sources deteriorates
Solution Approach 1:
The patent implements preliminary defect detection by performing holdup self-tests during manufacturing and before deployment. The system proactively identifies defects in secondary power sources (capacitors, batteries) before they cause system failures, using test circuits that measure holdup energy capacity and detect open capacitors or improper settings in advance
Solution Approach 2:
The patent establishes feedback mechanisms where test results from holdup self-tests are used to verify secondary power source functionality. The system continuously monitors and reports defect status, allowing for real-time assessment of power loss protection capabilities and enabling corrective actions before reliability is compromised
2Reliability
If memory systems overcompensate for holdup energy to ensure sufficient power during power loss, then power loss operation completion is improved, but energy storage cost and system complexity worsen
Solution Approach 1:
The patent applies parameter optimization by precisely measuring actual holdup energy capacity through self-tests and adjusting the energy storage design parameters accordingly. Instead of using fixed overcompensation margins, the system determines the exact holdup energy requirements based on measured values, optimizing capacitor arrays and battery configurations to meet minimum requirements without unnecessary excess
Solution Approach 2:
The patent implements self-verification where the memory system automatically tests and validates its own holdup energy capacity. The system performs self-diagnosis of power loss protection capabilities, eliminating the need for external testing equipment and enabling autonomous verification of whether the holdup design meets required specifications
3Ease of manufacture
If conventional systems cannot detect defects in secondary power sources, then manufacturing simplicity is improved, but system compromise risk worsens
Solution Approach 1:
The patent introduces intermediary test circuits and diagnostic components that mediate between the secondary power sources and the system. These intermediaries enable defect detection without fundamentally redesigning the power supply architecture, allowing conventional manufacturing processes to be maintained while adding verification capabilities that prevent undetected defects from compromising system security
Data Source
AI summary
Described herein is a system that includes a memory component and a processing device coupled to the memory component. The processing device identifies, in a test mode, a memory location of a memory component that is available to write test data, and detects a loss of power to the system while in the test mode. Responsive to detection of the loss of power, the processing device performs a continuous sequence of write operations to write the test data to the memory location using holdup energy until an amount of holdup energy is expended. After reboot of the system, the processing device determines a number of write operations successfully completed in the memory location by the continuous sequence of write operations before the amount of holdup energy is expended, and determines whether the number of write operations successfully completed satisfies a defect criterion. Responsive to the number of write operations successfully completed satisfying the defect criterion, the processing device reports a defect associated with the holdup energy.