Memory Pipeline Clock Synchronization for Hold-Time Failure Mitigation

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Solution Overview

Problem

Memory devices experience hold time failures due to timing mismatches between memory clock signals and pipeline clock signals, leading to incorrect data transfer and reduced reliability.

Innovation Solution

Implementing a dual pulse generator system that generates pipeline clock signals based on both a delayed and a memory clock signal, synchronized to mitigate hold time failures by ensuring proper timing alignment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single clock signal is used to control both memory cells and pipeline, then device complexity is reduced, but hold time failures occur due to timing mismatches

Engineering Contradiction:
Improveclock signal generationVSAvoidhold time compliance
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The clock signal generation is segmented into two separate pulse generators: a first pulse generator that generates a memory clock signal based on a first delayed clock signal, and a second pulse generator that generates a pipeline clock signal based on a second delayed clock signal and the memory clock signal. This segmentation allows independent optimization of timing for memory cells and pipeline stages, resolving the hold time failure issue while maintaining manageable device complexity.

Inventive Principle:
Principle #1Segmentation

2Device complexity

If pipeline clock signal is generated solely based on delayed clock signal, then device complexity is reduced, but timing alignment between memory and pipeline deteriorates

Engineering Contradiction:
Improveclock signal generationVSAvoidtiming alignment
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The second pulse generator is configured to generate the pipeline clock signal based on both the second delayed clock signal and the memory clock signal. By using the memory clock signal (which is already properly timed relative to memory cells) as a reference, the pipeline clock signal achieves correct timing alignment without requiring complex delay adjustment circuits.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If hold time margin is increased to prevent failures, then reliability is improved, but data transfer speed decreases

Engineering Contradiction:
Improvehold time marginVSAvoiddata transfer speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The invention changes the timing parameters of the pipeline clock signal by generating it based on the memory clock signal rather than solely on the delayed clock signal. This parameter change ensures that the pipeline clock signal has the appropriate phase and timing relationship with respect to the memory clock signal, providing sufficient hold time margin while maintaining high data transfer speed.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12400689B2Circuits and methods of mitigating hold time failure of pipeline for memory device
Publication Date: 2025.08.26 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12400689B2 patent drawing
  • US12400689B2 patent drawing
  • US12400689B2 patent drawing

AI summary

A memory device includes one or more memory cells, and a pipeline coupled to the one or more memory cells. The memory device includes a first pulse generator coupled to the one or more memory cells. The first pulse generator is configured to generate, based on a first delayed clock signal, a memory clock signal to control the one or more memory cells. The first delayed clock signal is delayed with respect to a clock signal. The memory device includes a second pulse generator to generate, based on a second delayed clock signal and the memory clock signal, a pipeline clock signal to provide data from the one or more memory cells through the pipeline. The second delayed clock signal is delayed with respect to the clock signal.