Memory Power-On-Reset Circuit for PVT-Stable Voltage Detection
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Solution Overview
Problem
Existing power-on-reset (POR) circuitries in memory sub-systems are vulnerable to process-voltage-temperature (PVT) variation effects, leading to inaccurate measurement of power supply voltage, which can result in premature reset of memory sub-systems.
Innovation Solution
A POR component with multiple voltage generators, including a reference voltage generator and a power-up voltage generator, that are designed to be insensitive to PVT variations, ensuring a reliable measurement of power supply voltage by using a steady reference voltage to indicate when the power supply is sufficiently high for proper reset.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional POR circuitries are used, then the device can perform power-on-reset function, but the voltage measurement is inaccurate due to PVT variation effects
Solution Approach 1:
The patent changes the reference voltage parameter from a fixed conventional value to a dynamically adjusted value that compensates for PVT variations. The reference voltage generator modifies its output voltage based on detected PVT conditions, ensuring accurate power supply voltage measurement across varying temperature and process conditions.
Solution Approach 2:
The patent implements a feedback mechanism where the POR circuit continuously monitors the power supply voltage and compares it against a dynamically adjusted reference voltage. The comparison result feeds back to control the reset signal generation, ensuring accurate reset timing even when PVT variations occur.
2Area of stationary object
If POR circuitry is made smaller to reduce device size, then manufacturing area is reduced, but the capability to use wide range of resistance and capacitance values is limited
Solution Approach 1:
The patent uses parameter changes in the form of dynamically adjustable reference voltage levels that allow the POR circuit to adapt to different resistance and capacitance values without requiring physical changes to the circuit components. This enables a compact design that maintains versatility across different operating conditions.
Solution Approach 2:
The POR circuit is designed with multi-functional capability to handle a wide range of resistance and capacitance values within a small area. The circuit can operate with different RC time constants by adjusting its reference voltage and comparison thresholds, making it universally applicable to various memory sub-system configurations.
3Device complexity
If diode-based POR circuitry is used to simplify design, then device complexity is reduced, but the circuit cannot function properly when power supply voltage is small compared to diode forward voltage
Solution Approach 1:
The patent introduces an intermediary reference voltage generator that mediates between the power supply voltage and the comparison logic. This reference voltage is adjusted to account for diode forward voltage drops, allowing the simplified diode-based circuit to function reliably even when the power supply voltage is small.
Solution Approach 2:
The patent dynamically changes the reference voltage parameter to compensate for diode forward voltage variations. By adjusting the reference voltage based on the actual power supply level and diode characteristics, the simplified circuit maintains reliability across different voltage conditions without increasing complexity.
Data Source
AI summary
A system can include a voltage generator configured to generate a reference voltage, a power-up voltage, and a replicated voltage based on a power supply voltage. The system can further include a logic sub-component coupled to the voltage generator and configured to output a reset signal based on a comparison of the reference voltage to the power-up voltage and an indication that the reference voltage that has entered a steady state and is reliable as a measurement with respect to a voltage level of the power supply voltage. The indication can be determined based on a comparison of the replicated voltage to a particular threshold voltage level.