3D Semiconductor Memory Power Pad and Segmented Bit Line

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Solution Overview

Problem

Existing semiconductor memory devices face challenges in stably providing operating voltages to peripheral circuit elements due to limited power transfer paths, which can lead to unreliable device performance.

Innovation Solution

The semiconductor memory device incorporates a power pad disposed between bit line sections over dummy blocks, creating additional power transfer paths by cutting bit lines, thereby securing sufficient power paths and ensuring stable voltage delivery to peripheral circuit elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If bit lines are continuous over dummy blocks, then manufacturing process is simpler, but power transfer paths are insufficient leading to unstable operating voltage supply

Engineering Contradiction:
Improvestability of operating voltage supplyVSAvoidbit line configuration complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The bit lines are segmented into first and second bit line sections that extend in opposite directions from both ends of the dummy block. This segmentation creates separate power transfer paths that allow power pads to be disposed between the sections, enabling sufficient power delivery to peripheral circuit elements while maintaining a manageable structural complexity through systematic arrangement.

Inventive Principle:
Principle #1Segmentation

2Reliability

If power pads are disposed between bit line sections, then power transfer paths are sufficient, but bit lines must be divided and routed around dummy blocks increasing structural complexity

Engineering Contradiction:
Improvepower delivery stabilityVSAvoidbit line and power pad layout complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The bit lines are extended into the third dimension by routing them over the dummy blocks in a vertical arrangement, with first and second bit line sections extending in opposite directions from both ends of the dummy block. This dimensional approach allows power pads to be disposed in the space between bit line sections, creating sufficient power transfer paths while organizing the complex layout in a systematic three-dimensional structure.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If bit lines extend continuously across the device, then manufacturing is easier, but power transfer paths are limited causing unstable peripheral circuit operation

Engineering Contradiction:
Improveperipheral circuit operation stabilityVSAvoidbit line fabrication simplicity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The bit lines are divided into first and second bit line sections that extend in opposite directions from both ends of the dummy block, with power pads disposed between these sections. This segmentation creates multiple power transfer paths that ensure stable operation of peripheral circuit elements while maintaining manufacturing feasibility through a systematic division of the bit line structure into manageable sections.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS10573659B2Semiconductor memory device of three-dimensional structure
Publication Date: 2020.02.25 SK HYNIX INC
  • US10573659B2 patent drawing
  • US10573659B2 patent drawing
  • US10573659B2 patent drawing

AI summary

A semiconductor memory device includes a logic structure including a peripheral circuit element which is formed over a substrate, a bottom dielectric layer which covers the peripheral circuit element and a bottom wiring line which is disposed in the bottom dielectric layer and is coupled to the peripheral circuit element; a memory structure stacked over the logic structure in a first direction perpendicular to a top surface of the substrate; a bit line disposed over a first top dielectric layer which covers the memory structure, extending in a second direction parallel to the top surface of the substrate, and divided into first and second bit line sections; and a power pad disposed over the first top dielectric layer between the first bit line section and the second bit line section, and coupled to the bottom wiring line through a power coupling contact which passes through the memory structure.