Memory Self-Testing Device for Simultaneous Channel Control
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Solution Overview
Problem
Conventional memory self-testing devices require multiple testing devices and lengthy processes to test multiple channels and memory control units, leading to increased activation time and circuit costs.
Innovation Solution
A memory self-testing device and method that uses a single testing device to simultaneously test multiple memory control units by generating access request signals, determining a leading feedback signal, and transmitting data, allowing for accelerated testing without significant cost increases.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple testing devices are used to simultaneously test multiple memory control units, then test time is reduced, but circuit costs are significantly increased
Solution Approach 1:
A single memory self-testing device is designed to perform multiple testing functions simultaneously. The device can selectively test different numbers of memory control units (e.g., 1, 2, 4, or all N units) by configuring the channel control unit, making one device universal for various testing scenarios that previously required multiple dedicated devices.
Solution Approach 2:
The testing process is divided into manageable segments where the channel control unit selectively activates and controls testing of specific memory control units. This segmentation allows the single testing device to manage multiple testing operations independently, achieving parallel testing capability without requiring multiple complete testing devices.
2Device complexity
If a single testing device tests multiple memory control units sequentially, then circuit costs are reduced, but activation time is excessively long
Solution Approach 1:
The testing device maintains continuous useful action by implementing parallel testing operations. While the channel control unit directs test operations to multiple memory control units simultaneously, the testing device continuously performs testing functions without idle periods, eliminating the sequential waiting time that characterized traditional single-unit testing approaches.
Solution Approach 2:
The testing system dynamically adapts its operation mode based on configuration needs. The channel control unit can dynamically select between different testing configurations (testing 1 unit, 2 units, 4 units, or all N units), allowing the system to optimize between test speed and resource usage in real-time based on operational requirements.
Data Source
AI summary
A memory self-testing device for testing a plurality of memory control units includes: a test control unit, coupled to the memory control units, generating a plurality of access request signals and a plurality of sets of data; a channel control unit, coupled to the test control unit and the memory control units, determining a leading feedback signal among a plurality of feedback signals; and a data control unit, coupled to the test control unit and the memory control units, storing the sets of data, and transmitting the sets of data to the memory control units according to a plurality of read/write signals. The feedback signals and the read/write signals are generated by the memory control units in response to the access request signals. The test control units generate the sets of data according to the leading feedback signal.