Memory Sense Operation for Error Correction Data Measurement
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Solution Overview
Problem
Existing memory technologies face read latency issues due to the need for additional sense operations to accurately determine the threshold voltage range of a memory cell, leading to potential misreads and increased error correction requirements.
Innovation Solution
A method involving multiple measurements with a single memory sense operation using a first word line sensing voltage, followed by adjustments to determine error correction data, allowing for more precise positioning of the stored threshold voltage within a range, thereby reducing read latency and improving data accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If additional sense operations are performed to measure soft data for error correction, then data accuracy is improved, but read latency increases
Solution Approach 1:
The patent combines multiple measurements (data measurement and soft data measurement) into a single sense operation. The sense amplifier performs both the primary data read and the error correction information measurement simultaneously by utilizing the same sensing event, thereby eliminating the need for separate sense operations and reducing read latency while maintaining data accuracy
Solution Approach 2:
The sense amplifier is designed to perform multiple functions within a single operation: it measures both the primary data value (hard data) and the error correction information (soft data) during the same sensing event. This multi-functionality allows the system to obtain both data accuracy and error correction capabilities without increasing the number of sense operations
2Measurement precision
If multiple sense operations are used to determine threshold voltage range, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent merges multiple measurement objectives into a single sense operation structure. By using the same sense amplifier and sensing event to obtain both data values and error correction information, the system reduces the complexity associated with coordinating multiple separate sense operations while maintaining high measurement precision through integrated measurement
3Reliability
If error correction data is collected through additional measurements, then reliability is improved, but productivity decreases
Solution Approach 1:
The patent ensures continuous useful action by performing both data reading and error correction measurement during the same sense operation. This eliminates idle time between operations and maintains continuous productive work, thereby improving read speed while still collecting comprehensive error correction data for enhanced reliability
Data Source
AI summary
Multiple measurements are made with one memory sense operation having a first word line sensing voltage on a memory cell. The multiple measurements include a first measurement, of whether the memory cell stores either: (a) data corresponding to a first set of one or more threshold voltage ranges below the first word line sensing voltage of the one memory sense operation, or (b) data corresponding to a second set of one or more threshold voltage ranges above the first word line sensing voltage of the one memory sense operation. The multiple measurements include a second measurement, of error correction data of the memory cell indicating relative position within a particular threshold voltage range of a stored threshold voltage in the memory cell.