Memory Sub Block Erase Parameter Grouping
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current memory devices face inefficiencies in erase operations due to the lack of optimal parameter sets for sub-blocks within memory blocks, leading to suboptimal performance.
Innovation Solution
A memory device and method that classify sub-blocks into groups based on erase operation results, using default or optimal parameters for erase operations, and dynamically adjust parameters based on group classification and sub-block positions or channel diameters to enhance erase performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single default parameter set is used for all sub blocks in a memory block, then the device complexity is reduced, but the erase performance becomes suboptimal for specific sub block conditions
Solution Approach 1:
The patent applies local quality by classifying sub blocks into different groups (first group, second group, third group) based on their specific conditions such as channel diameter and erase operation results. Each group is assigned different parameter sets (default parameters for first group, optimal parameters for second and third groups), allowing tailored erase operations for different sub block regions rather than using a uniform parameter set for the entire memory block.
Solution Approach 2:
The patent implements dynamics by dynamically selecting parameter sets based on real-time classification of sub blocks. The parameter setter dynamically determines whether to use default or optimal parameters based on the group classification results, and the controller dynamically adjusts erase operation parameters according to the determined group, enabling adaptive parameter management that responds to actual sub block conditions.
2Reliability
If optimal parameters are used for all sub blocks, then erase performance is maximized, but the device complexity increases due to multiple parameter sets
Solution Approach 1:
The patent applies local quality by classifying sub blocks into different groups (first group, second group, third group) based on their specific conditions such as channel diameter and erase operation results. Each group is assigned different parameter sets (default parameters for first group, optimal parameters for second and third groups), allowing tailored erase operations for different sub block regions rather than using a uniform parameter set for the entire memory block.
Solution Approach 2:
The patent segments the memory block into multiple sub block groups based on their characteristics. The parameter setter divides sub blocks into first, second, and third groups according to their channel diameters and erase operation outcomes, then applies different parameter sets to each segment. This segmentation allows the system to manage complexity by organizing parameters in a structured manner rather than treating all sub blocks uniformly.
3Ease of operation
If erase operations are performed without group classification, then the operation simplicity is maintained, but the parameter optimization is insufficient
Solution Approach 1:
The patent applies preliminary action by performing group classification before executing erase operations. The parameter setter classifies sub blocks into different groups based on their conditions (channel diameter, erase results) before the actual erase operation begins. This preliminary classification enables the system to pre-determine the appropriate parameter set, ensuring optimized erase parameters are applied from the start without complicating the overall operation flow.
Solution Approach 2:
The patent implements feedback by using erase operation results to classify sub blocks into different groups. The parameter setter analyzes the results of erase operations on certain sub blocks and uses this feedback information to determine whether to apply default or optimal parameters to other sub blocks. This feedback mechanism ensures that parameter optimization is continuously improved based on actual performance data while maintaining operational simplicity.
Data Source
AI summary
A memory device, and a method of operating the memory device, includes a memory block, a peripheral circuit, an erase controller, and a parameter setter. The memory device includes a plurality of sub blocks. The peripheral circuit performs an erase operation on a target sub block among the plurality of sub blocks. The erase controller controls the peripheral circuit to perform the erase operation based on a default parameter or an optimal parameter according to a group to which the target sub block belongs among first, second, and third groups. The parameter setter sets the optimal parameter based on a result of the erase operation when the target sub block is included in the first group or the third group.