Semiconductor Memory Temperature Data Circuit Error Correction
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Solution Overview
Problem
The existing circuit for outputting temperature data in semiconductor memory apparatuses faces errors due to unknown fuse code values, inconvenient correction processes, and residual errors after temperature adjustments, leading to increased processing time and inaccuracies.
Innovation Solution
A circuit and method that include a temperature detecting circuit, an A/D converter, and a temperature data correcting unit, which utilize adjustment codes to correct temperature code errors by adjusting reference voltages and performing primary and secondary corrections through test modes, ensuring accurate and efficient error removal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If analog voltage adjustment is used to correct temperature code errors, then some error correction is achieved, but residual errors remain and the correction process is time-consuming
Solution Approach 1:
The correction process is divided into two distinct segments: primary correction using analog voltage adjustment to eliminate most errors, and secondary correction using digital code adjustment to remove residual errors. This segmentation allows each method to be optimized for its specific purpose, with the digital stage providing precise final adjustment without the time constraints of analog tuning.
Solution Approach 2:
The primary correction using analog voltage adjustment is performed first as a preliminary step to eliminate the bulk of temperature code errors. This preliminary action reduces the error magnitude significantly, making the subsequent secondary digital correction more efficient and accurate, as it only needs to handle residual small errors rather than large deviations.
2Measurement precision
If fuse code values are used for correction, then error correction is possible, but the process becomes inconvenient and time-consuming due to unknown fuse code values
Solution Approach 1:
The invention replaces the mechanical fuse-cutting process with a digital code adjustment mechanism. Instead of physically cutting fuses to change resistance values, the system uses a correction code stored in a register that can be digitally adjusted. This substitution eliminates the inconvenience of physical fuse manipulation while maintaining the ability to perform precise error correction through digital means.
Solution Approach 2:
The invention creates a digital copy of the correction mechanism in the form of a correction code stored in a register. This digital copy replicates the functionality of the physical fuse code system but with the added benefit of being easily modifiable through software or control logic, eliminating the need for physical fuse cutting and making the correction process much more convenient.
3Measurement precision
If analog voltage levels are adjusted to correct errors, then temperature code accuracy improves, but output errors from analog adjustments remain
Solution Approach 1:
The invention introduces a digital correction code as an intermediary between the analog voltage adjustment and the final temperature code output. The analog adjustment first corrects the bulk of the error, then the digital correction code serves as an intermediary layer that fine-tunes the result and eliminates residual errors, ensuring the final output is free from both analog and digital error sources.
Solution Approach 2:
The invention changes the parameter domain from purely analog voltage adjustment to a hybrid analog-digital approach. By introducing a digital correction code that can be precisely controlled and stored, the system transitions from continuous analog parameter adjustment to discrete digital parameter adjustment, eliminating the inherent inaccuracies and residual errors associated with analog voltage levels.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively removes output errors across a wide range and minimizes residual errors, simplifying the correction process and reducing processing time, enabling reliable temperature data output.
Implementation Method 1
The temperature sensor 110 outputs a temperature voltage VTEMP that is inversely proportional to an internal temperature of a semiconductor memory apparatus by using temperature characteristics of a bipolar junction transistor (BJT)
Data Source
AI summary
A circuit for outputting temperature data of a semiconductor memory apparatus includes a temperature detecting circuit that generates a temperature voltage corresponding to a change in temperature and outputs the temperature voltage, an A/D converter that converts the temperature voltage into a first temperature code and outputs it, and a temperature data correcting unit that outputs a second temperature code obtained by correcting an error of the first temperature code using a correction code.