Memory Test System with Programmable Time Delay Loopback
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Solution Overview
Problem
Traditional testing tools for high-speed I/O interfaces and memory are expensive and inconvenient, making it difficult to validate and set up high-speed computer systems effectively without external tools.
Innovation Solution
A memory test system comprising a control unit, data reading and writing channels, and a test channel with a loopback configuration that generates and outputs read and write commands with a programmable time interval to account for time delays, allowing for internal testing without external tools.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional external testing tools are used to test high-speed I/O interface and memory, then measurement precision and reliability are improved, but device complexity and cost increase
Solution Approach 1:
The patent merges the testing functionality into the existing memory system by utilizing the memory device itself as the test target and employing internal resources (control unit, data channels) to perform the testing, thereby eliminating the need for separate external testing tools and reducing overall system complexity
Solution Approach 2:
The memory device is designed to serve dual purposes: normal operation and self-testing. The control unit and data channels are configured to perform both regular memory operations and testing operations, making the system multi-functional and eliminating the need for dedicated testing equipment
2Measurement precision
If traditional external testing tools are used for high-speed memory testing, then measurement precision is improved, but ease of operation deteriorates
Solution Approach 1:
The memory system performs self-testing through integrated control units and data channels that are already present in the memory device. The control unit generates test commands and the data channels transmit test data without requiring external testing equipment, making the system self-sufficient and easier to operate
3Productivity
If read and write commands are issued simultaneously to account for time delay, then productivity is improved, but manufacturing precision deteriorates
Solution Approach 1:
The control unit dynamically adjusts the timing of command issuance based on the specific time delay characteristics of the test channel. By making the timing flexible and adaptive rather than fixed, the system can accommodate variable delays while maintaining both productivity and timing precision
Solution Approach 2:
The system changes the timing parameter of command issuance to compensate for time delays in the test channel. By adjusting when commands are sent based on measured or known delay characteristics, the system maintains synchronization and ensures accurate testing while preserving productivity
Data Source
AI summary
A memory test system and a memory test method are provided. The memory test system includes a control unit, a data reading channel, a data writing channel and a test channel. The control unit generates and outputs a first read and a first write command. The data reading channel and the data writing channel coupled to the memory unit, and the control unit respectively reads data from the memory unit at a first time and writes the data back to the memory unit at a second time according to the first read command and the first write command. The test channel receives the data from the data reading channel through an input end and outputs the data back to the data writing channel through an output end after a time delay. The time delay is substantially equal to a time interval between the first time and the second time.