Metal-Containing Resist Development in Weak-Acid Atmosphere

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The miniaturization of semiconductor devices leads to issues with pattern collapse due to residual developing or cleaning solutions in fine resist patterns, especially when using chemically amplified or metal-containing resists, which conventional developing methods fail to address effectively.

Innovation Solution

A substrate treatment method involving exposure to an acid atmosphere containing weak acid gas and mist, combined with heating, is used to develop a metal-containing resist film without conventional developing solutions, thereby forming the resist pattern without surface tension-induced collapse.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional developing solutions are used to develop metal-containing resist, then development is achieved, but pattern collapse occurs due to surface tension of residual solutions

Engineering Contradiction:
Improvepattern integrityVSAvoidpattern collapse
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The patent removes the harmful liquid developing solution from the system and replaces it with a gas-phase developing atmosphere. By extracting the liquid phase and using gas (acid atmosphere) for development, the surface tension issue that causes pattern collapse is eliminated, while still achieving effective resist development.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent substitutes the liquid-based developing mechanism with a gas-based chemical atmosphere. Instead of using liquid developing solution that creates surface tension problems, the system uses an acid atmosphere (gas phase) to achieve chemical development of the resist, replacing the mechanical/physical liquid development process.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Manufacturing precision

If liquid developing solution is supplied to the substrate, then development is achieved, but contamination and residue remain in fine resist patterns

Engineering Contradiction:
Improvefine pattern qualityVSAvoidcontamination
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent extracts and removes the liquid developing solution from the fine resist pattern areas. By using gas-phase development, no liquid residue is left in the fine patterns, eliminating contamination sources while maintaining development effectiveness in high-resolution structures.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The gas atmosphere acts as an intermediary medium that enables chemical development without directly contacting the resist as a liquid. The acid atmosphere serves as a mediating chemical environment that facilitates resist dissolution without leaving harmful residues, unlike liquid solutions.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If acid atmosphere is used for development, then pattern collapse is prevented, but stronger acid may damage apparatus components

Engineering Contradiction:
Improvepattern stabilityVSAvoidapparatus damage
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent changes the concentration parameter of the acid atmosphere to an optimal level. By controlling the acid concentration to be within a specific range (0.1-10% by volume), the system achieves effective resist development and pattern stability while preventing damage to apparatus components through moderate acid strength.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The acid atmosphere is applied locally and temporarily only during the development process. The acid concentration is controlled to be high enough for effective development but low enough to avoid permanent damage to apparatus. After development, the atmosphere is vented, leaving no residual acid on apparatus components.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method effectively prevents pattern collapse and reduces contamination risks, maintaining pattern integrity and minimizing damage to apparatus components, while ensuring safe and controlled development conditions.

Implementation Method 1

exposing the substrate to an acid atmosphere being an atmosphere containing at least any one of gas and mist of a weak acid

Methodology Applied
Scientific EffectChemical reaction: Chemical Bonding

Implementation Method 2

while heating the substrate

Methodology Applied
Scientific EffectHeating: Heating

Data Source

PatentUS20250321490A1Substrate treatment method, substrate treatment apparatus, and computer storage medium
Publication Date: 2025.10.16 TOKYO ELECTRON LTD
  • US20250321490A1 patent drawing
  • US20250321490A1 patent drawing
  • US20250321490A1 patent drawing

AI summary

A substrate treatment method includes developing a substrate on which a coating film of a metal-containing resist has been formed and which has been subjected to exposure processing and a heat treatment after the exposure processing, wherein the developing includes exposing the substrate to an acid atmosphere being an atmosphere containing at least any one of gas and mist of a weak acid, while heating the substrate.