A polymer resist underlayer improves thin photoresist adhesion, film uniformity, and exposure sensitivity for fine semiconductor patterning.
A carboxylate-stabilized cerium initiator enables acid-free vinyl acetate grafting on cellulose nanocrystals with high yield and uniform dispersion.
A catalyst-free photoresist combines unsaturated monomers and epoxy compounds to form optical films below 150°C with strong chemical resistance.
A low-dispersity polymer resist limits acid diffusion to improve small-feature resolution, line-edge roughness, profile rectangularity, and etch resistance.
A thermal base generator enables imide ring-closing at 200°C or lower while maintaining storage stability, fine patterning, and chemical resistance.
Magnetic fixing members hold a substrate heating plate in position while allowing thermal expansion, preventing tilt, sealing failure, and particle contamination.
An organoindium EUV resist uses pretreatment and gas development to keep ultrathin patterns sensitive, precise, and etch resistant.