Metrology System Using Dual Light Beam Patterns for Position Tracking
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Solution Overview
Problem
Existing metrology systems for robot movement systems face challenges in achieving high accuracy and reliability for position and orientation determination, particularly in applications requiring precise workpiece measurements and manufacturing processes.
Innovation Solution
A metrology system that includes a sensor configuration with multiple light beam sensors, a light beam source configuration capable of directing different patterns of light beams, and a processing portion to determine the position and orientation of the light beam source configuration, which is indicative of the end tool's position and orientation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional position sensors (e.g., rotary encoders) are used to determine robot arm positioning, then the system is simple to implement, but the positioning accuracy is limited to approximately 100 microns
Solution Approach 1:
The patent replaces mechanical position sensors (rotary encoders) with an optical measurement system using light beams and light beam sensors. This substitution enables positioning accuracy in the sub-micron range while maintaining system simplicity through the use of straightforward optical components and evaluation logic.
2Measurement precision
If calibration techniques are used to improve robot system accuracy, then positioning precision can be enhanced, but the calibration process requires significant time and may not provide desired accuracy for all orientations
Solution Approach 1:
The patent implements a self-measuring system where the robot system automatically determines its own position and orientation using light beams during operation. The system continuously measures its state without requiring external calibration equipment or procedures, enabling real-time accurate positioning for all orientations without time-consuming calibration steps.
3Measurement precision
If multiple light beam patterns are used to track position and orientation, then measurement precision is improved, but the device complexity increases
Solution Approach 1:
The patent divides the light beam system into multiple independent light beam sources, each emitting light beams in different spatial directions. This segmentation allows the system to determine both position and orientation independently through simple evaluation logic, achieving high measurement precision without increasing overall system complexity.
Solution Approach 2:
The patent uses light beams extending in different spatial dimensions (directions) to encode position and orientation information. By utilizing the three-dimensional spatial arrangement of light beams, the system achieves accurate 6-degree-of-freedom tracking through straightforward geometric evaluation without complex additional components.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides improved accuracy and reliability for position and orientation determination, enabling precise tracking of the end tool's position and orientation, even in complex orientations and movements.
Implementation Method 1
The light beam source configuration is configured to direct a first pattern of light beams and a second pattern of light beams to light beam sensors of the sensor configuration to indicate a position and orientation of the light beam source configuration
Data Source
AI summary
A metrology system is provided for use with a movement system that moves an end tool. The metrology system includes a sensor configuration, a light beam source configuration and a processing portion. The light beam source configuration directs a first pattern of light beams and a second pattern of light beams to light beam sensors to indicate a position and orientation of the light beam source configuration. The first pattern of light beams has a lower density of light beams as compared to the second pattern of light beams. Measurement signals from the light beam sensors are processed to determine a position and orientation of the light beam source configuration. The first pattern light beams and the second pattern light beams have at least one different characteristic (e.g., wavelength, polarity, timing, etc.) that enables the first pattern light beams to be distinguished from the second pattern light beams.