Microdevice Cartridge Mapping for Adjacent Parameter Uniformity
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Solution Overview
Problem
Existing methods for populating system substrates with micro devices fail to account for parameter variations among adjacent devices, leading to inconsistencies and non-uniformity, particularly in parameters such as color point and performance.
Innovation Solution
A method involving binning and compensation of micro devices based on parameter thresholds and distribution maps to ensure uniformity across the system substrate, using methods like calculating means or medians, adjusting device characteristics, and employing compensation values to align adjacent areas within predefined thresholds.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If micro devices are populated from multiple cartridges without parameter matching, then productivity is improved through parallel processing, but manufacturing precision deteriorates due to parameter variations between adjacent devices
Solution Approach 1:
The patent extracts and stores parameter information for each micro device in each cartridge before population. This preliminary characterization allows the system to plan the population sequence in advance, selecting cartridges and devices that will maintain parameter uniformity across adjacent positions on the system substrate, thus resolving the contradiction between high-speed parallel population and parameter precision
Solution Approach 2:
The system dynamically changes the population parameters by selecting specific micro devices from specific cartridges based on their extracted parameter values. By adjusting which cartridge contributes the next device and which position it occupies, the system maintains parameter uniformity across the substrate while continuing high-speed population from multiple cartridges
2Manufacturing precision
If parameter extraction and matching is performed for all micro devices, then manufacturing precision is improved through uniformity control, but device complexity increases due to additional data processing requirements
Solution Approach 1:
The patent applies local quality by focusing parameter extraction and matching only on the local level of individual cartridges and their immediate contribution to the system substrate. Rather than globally optimizing all devices simultaneously, the system processes each cartridge's parameter data locally and makes placement decisions based on local parameter uniformity requirements, reducing overall data processing complexity while maintaining precision
Data Source
AI summary
This disclosure is related to compensation of micro devices based on cartridge information.