Microfluidic Chip Testing via Common Capillary Wafer

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Solution Overview

Problem

The existing methods for manufacturing and testing microfluidic chips are time-consuming and costly due to the need for individual calibration and testing of each chip after separation from a glass sheet, which involves reconnecting fluid supply lines for each chip.

Innovation Solution

Testing microfluidic chips before separation from a common wafer, where a single capillary is connected to a test fluid supply, allowing multiple chips to be tested in parallel or concurrently, with options for hydraulic, electronic, or mechanical testing, and using a device with a wafer holder and inlet connector for efficient fluid supply and detection of leaks or pressure losses.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If individual testing and calibration of each chip is performed after separation from the glass sheet, then accurate calibration of each chip is achieved, but testing time and costs increase significantly

Engineering Contradiction:
Improvecalibration accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

Multiple chips are tested simultaneously by connecting them in parallel to a common fluid supply and waste line. The test device connects to multiple chips at once through a single fluid supply connection and a single waste line connection, allowing parallel testing of multiple chips without requiring individual reconnection for each chip.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The test device is designed with universal connections that can test multiple chips simultaneously. A single fluid supply connection and single waste line connection serve multiple chips in parallel, making the testing system multi-functional and efficient.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If individual reconnection of fluid supply lines is performed for each chip, then proper fluid supply to each chip is ensured, but the complexity and time of the testing process increases

Engineering Contradiction:
Improvefluid supply reliabilityVSAvoidtesting process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Multiple chips are connected in parallel to a common fluid supply line and common waste line. This merging of fluid supply paths allows simultaneous testing of multiple chips while reducing the number of connections required, thereby simplifying the testing process while maintaining reliable fluid supply to each chip.

Inventive Principle:
Principle #5Merging (Combining)

3Productivity

If multiple chips are tested in parallel on a common wafer, then testing time is reduced, but the manufacturing precision required for the common capillary increases

Engineering Contradiction:
Improvetesting throughputVSAvoidcapillary alignment precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The wafer is divided into multiple regions, each containing a chip with its own capillary that connects to a common fluid supply channel. This segmentation allows independent chip design and function while enabling parallel testing through the common channel structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The common capillary structure serves multiple functions: it provides fluid supply to multiple chips simultaneously, acts as a waste line for all chips, and enables parallel testing. This multi-functionality increases productivity while the modular design maintains manageable manufacturing precision requirements.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces testing time and costs by enabling simultaneous testing of multiple chips on a common capillary, ensuring accurate calibration and reducing the need for reconnection of fluid supply lines, while allowing for visual and electronic evaluation of fluid flow.

Implementation Method 1

a common capillary (2) for through-flow of a fluid (F)

Methodology Applied
Scientific EffectFluid flow:

Implementation Method 2

detecting possible flow leaks and/or pressure losses while the test fluid is supplied to the common capillary

Methodology Applied
Scientific EffectPressure measurement:

Data Source

PatentEP2269947B1Method for manufacturing and testing microfluidic chips
Publication Date: 2015.04.01 MICRONIT MICROTECHNOLOGIES BV
  • EP2269947B1 patent drawingFigure 1~3
  • EP2269947B1 patent drawingFigure 4~5

AI summary

The invention relates to a method for manufacturing and testing microfluidic chips having at least one capillary for through-flow of a fluid. The method comprises the following steps: - providing a starting material; - forming at least one shared capillary in the starting material; - arranging a plurality of functional elements in or over the shared capillary, thus forming a plurality of chips; - testing the chips by supplying a test fluid to the shared capillary; and - dividing the starting material into separate chips. The invention further relates to a device for testing microfluidic chips having at least one capillary for through-flow of a fluid. This device comprises a material holder for holding a starting material in a fixed position during testing, and an inlet connector for connecting a shared capillary formed in the starting material to a test fluid supply.