Micro-LED Reflective Layer Layout for Transfer Misalignment Detection

The patent applies preliminary action by providing alignment marks and reference patterns on the substrate before transferring the LEDs. These pre-prepared markers enable operators to check and adjust alignment before the actual transfer, ensuring precision even when transferring multiple LEDs in batch. The alignment marks serve as preliminary guides that prevent misalignment issues.

The patent implements feedback by incorporating visible alignment marks and reference patterns that provide immediate visual feedback during the transfer process. Operators can observe the alignment status in real-time through microscopy or visual inspection of the markers, allowing for immediate correction rather than waiting until the end of the transfer process. This continuous feedback mechanism reduces both time loss and improves precision.

The patent applies segmentation by dividing the alignment verification process into discrete checkpoints using specific reference patterns and markers for each transfer batch. Instead of one comprehensive check at the end, the alignment is segmented into multiple verification stages, each with its own reference markers. This allows precision to be maintained across multiple transfer operations by verifying and correcting alignment at each segment rather than allowing errors to accumulate.