MicroLED Vacancy Repair Using Parallel Donor Coupon Transfer

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Solution Overview

Problem

The challenge lies in efficiently repairing vacancies on microLED display substrates resulting from manufacturing defects and chip failures during mass transfer, where donor wafers also contain non-functional chips, making it difficult to find an optimal sequence of transfers to fill all vacancies in as few steps as possible, as the problem is NP-hard and infeasible for large substrates.

Innovation Solution

A method involving the identification of target and donor substrates with vacancies, defining a bounding box to match chip positions, and using machine learning or algorithms to simulate and determine optimal translational offsets for parallel transfer of functional chips from donor coupons to fill vacancies on the target substrate, allowing for efficient repair in minimal transfers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional sequential methods are used to repair vacancies on large substrates, then completeness of vacancy filling can be achieved, but the number of transfer steps becomes excessively large and the process becomes infeasible

Engineering Contradiction:
Improvevacancy filling completenessVSAvoidnumber of transfer steps
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent divides the large substrate into multiple smaller sub-arrays, each containing a subset of the vacancies. By segmenting the repair task, the system can process multiple sub-arrays in parallel during each transfer step, dramatically reducing the total number of sequential transfers needed while ensuring all vacancies are filled

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a new dimension of parallelism by enabling simultaneous transfers to multiple different sub-arrays from a single donor array. Instead of sequentially filling one sub-array at a time, the system performs multi-target parallel transfers, effectively adding a dimensional layer to the transfer process that reduces the overall transfer step count

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If donor wafers with non-functional chips are used, then available donor substrates increase, but the difficulty of finding optimal transfer sequences increases significantly

Engineering Contradiction:
Improveavailable donor substratesVSAvoidtransfer sequence optimization complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent performs preliminary identification and mapping of functional chip locations on donor wafers before the actual transfer process. By pre-characterizing the donor substrates and creating detailed maps of functional chip positions, the system simplifies the subsequent optimization process, making it feasible to handle multiple donor wafers with non-functional chips without exponentially increasing computational complexity

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent creates digital representations or models of the donor and target arrays, including the locations of functional and non-functional chips. These virtual copies allow the system to simulate and evaluate multiple transfer sequences computationally, finding optimal solutions without physically attempting every possible sequence, thus managing the complexity of matching functional chips to vacancies across multiple donor substrates

Inventive Principle:
Principle #26Copying

3Reliability

If multiple transfer steps are used to fill vacancies, then all vacancies can be filled, but manufacturing yield decreases and waste increases

Engineering Contradiction:
Improvevacancy filling completenessVSAvoidmanufacturing yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent merges multiple transfer operations into fewer consolidated steps by enabling parallel transfers to multiple sub-arrays simultaneously. By combining what would traditionally be sequential operations into concurrent processes, the system reduces the total number of transfer steps required, thereby improving manufacturing yield and reducing waste associated with repeated handling and potential chip failures during multiple transfers

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20240339560A1System and method for repairing vacancies resulting from mass transfer of devices
Publication Date: 2024.10.10 GENESEE VALLEY INNOVATIONS LLC
  • US20240339560A1 patent drawing
  • US20240339560A1 patent drawing
  • US20240339560A1 patent drawing

AI summary

Data representations are formed of a target substrate and a plurality of donor coupons that are incompletely filled with functional chips. The data representations are abstracted into a current state description of the target substrate and the donor coupons and input into a machine learning model that has been trained on previous mass transfer sequences. An optimal output of the machine learning model defines at least a selected one or more of the donor coupons and corresponding functional chips of the selected one or more of the donor coupons used to fill the vacancies. A parallel transfer of the corresponding functional chips is performed to fill the vacancies on the target substrate using the selected one or more of the donor coupons.