Microscope Beam Path Manipulation for Refractive Index Aberrations
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Solution Overview
Problem
Current methods for examining samples in microscopes, particularly light-sheet microscopes, face challenges due to refractive index mismatches between the sample and immersion medium, leading to aberrations that degrade image quality and prevent the use of high numerical aperture objectives, which are necessary for high resolution and efficient light detection.
Innovation Solution
A method that ascertains the refractive index of the sample and/or optical medium and adjusts microscope parameters to manipulate the beam path, allowing for the use of high numerical aperture objectives and immersion media, thereby compensating for aberrations and maintaining image quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high numerical aperture objectives are used to achieve high resolution and efficient light detection, then imaging quality is improved, but refractive index mismatches cause severe aberrations that degrade image quality
Solution Approach 1:
The patent dynamically adjusts optical parameters including beam path manipulation and focal plane positioning based on measured refractive index values. The system changes focus position, beam angle, and other optical parameters to compensate for refractive index mismatches between sample and immersion medium, thereby enabling high NA objectives to function effectively despite aberrations
Solution Approach 2:
The system incorporates refractive index measurement as feedback to automatically adjust optical parameters. By measuring the actual refractive index of the sample or immersion medium and using this information to modify beam path and focus settings, the system creates a closed-loop control that compensates for aberrations in real-time
2Measurement precision
If iterative algorithms are used to compensate for aberrations, then image quality is improved, but recording time is increased and sample damage may occur
Solution Approach 1:
The patent performs refractive index measurement and optical parameter optimization before actual image recording begins. By determining the refractive index in advance and pre-adjusting the beam path and focus settings, the system eliminates the need for time-consuming iterative adjustments during recording, thereby reducing total recording time and minimizing sample exposure time
3Productivity
If refractive index of immersion medium is not adapted to sample, then imaging can proceed, but defocus and spherical aberrations occur that shift focal plane and deteriorate recording quality
Solution Approach 1:
Instead of physically changing the immersion medium composition to match the sample refractive index, the patent uses computational and optical methods to compensate for refractive index differences. The system measures the actual refractive index and applies corresponding optical corrections through beam path manipulation and focal plane adjustment, replacing the need for physical medium adaptation with parameter-based compensation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables rapid, gentle, and deterministic manipulation of the beam path, allowing for high-resolution imaging without iterative methods, reducing sample damage, and compensating for aberrations caused by refractive index variations, thus improving image quality and enabling the use of high NA objectives.
Implementation Method 1
a focal plane of a detection optical unit being shifted owing to different refraction caused by the refractive index of the immersion medium and/or of the sample
Data Source
AI summary
A method for manipulating at least one beam path in a microscope includes ascertaining a refractive index of a sample arranged in a sample volume and/or of an optical medium arranged in the sample volume. At least one microscope parameter is set in dependence on the ascertained refractive index for manipulating the beam path.