Phase-Affecting Property Measurements TRIZ Cases
- Optical Sensor With External Medium Placement
A compact optical sensor uses a transparent housing to monitor external media via refractive index shifts detected by a photodiode array.
- Equal-path interferometer with tilted optics for transparent surface profiling
Tilted partially reflective surfaces separate measurement and reference beams to block spurious reflections from multiple interfaces.
- Refractive Index Profile Measurement of Cylindrical Glass Bodies
Discarding higher-order diffracted beams eliminates striae-induced measurement errors, enabling precise refractive index profiling.
- Dielectric Coating Phase Shift Determination via Dual-Wavelength Measurement
A method determines phase shift in dielectric coatings using measurements at two specific wavenumbers.
- Holographic Scatterer Localization via Intensity Gradient Transforms
Intensity gradients locate scatterer centers using continuous field transforms for precise sub-pixel tracking.
- Interferometer Spatial Differential Demodulation
A demodulating interferometer performs spatial differential calculations on interference signals to generate depth-resolved images.
- Photonic Crystal Guided Resonance Microscopy
Dielectric photonic crystals replace dissipative noble metals to reduce background noise and improve signal contrast for nanoparticle detection.
- Microscope Beam Path Manipulation for Refractive Index Aberrations
A microscope adjusts beam paths using measured refractive index values to maintain high numerical aperture imaging.
- Immersion Fluid Refractive Index Monitoring Apparatus
Monitoring apparatus measures immersion fluid refractive index via light refraction to prevent contamination-induced resolution loss.
- 3D Refractive Index Tomography Using Wavefront Shaper
A wavefront shaper adjusts plane wave irradiation angles to measure 2D optical fields for 3D refractive index imaging.