Microscope Distance Determination Using Non-Telecentric Overview Camera

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Solution Overview

Problem

Modern microscopes face challenges in accurately determining the distance between the objective and sample plane, especially with multiwell plates, due to unknown sample carrier thickness and imprecise calibration, leading to difficulties in focusing and navigation.

Innovation Solution

A distance determination system for microscopes that includes a sample stage, an overview camera with a non-telecentric objective, and a machine-learning-based evaluation unit to associate structures in recorded images from different viewing angles, enabling precise distance calculation and improved focusing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual focusing and navigation methods are used in conventional microscopes, then the system is simple to operate, but the focusing speed and navigation accuracy are slow and imprecise

Engineering Contradiction:
Improvedistance determination accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

An overview camera is introduced as an intermediary device to capture images of the sample carrier from above. This camera provides additional spatial information that mediates between the complex task of distance determination and the simple need for accurate focusing, enabling precise z-position calculation without directly modifying the optical path of the microscope objective

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system transitions from two-dimensional image analysis (standard microscope images) to three-dimensional spatial understanding by incorporating overhead camera images. This additional dimensional information allows the system to determine the z-position of the sample plane by analyzing the apparent position of structures in the overhead view combined with their positions in standard microscope images

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 3:

The patent replaces manual mechanical focusing operations with an automated optical-mechanical system. The overview camera and image processing algorithm substitute for manual adjustment mechanisms, using optical imaging and computational analysis to automatically determine the correct focus position based on the detected z-position of the sample plane

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Adaptability or versatility

If the bottom thickness of the sample carrier is unknown or varies, then the system can accommodate different sample carriers, but the distance between the objective and sample plane becomes uncertain

Engineering Contradiction:
Improvesample carrier compatibilityVSAvoiddistance measurement accuracy
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The system performs self-calibration by automatically detecting the z-position of the sample plane through image analysis. Instead of requiring pre-known sample carrier specifications, the system independently determines the actual position by analyzing the apparent position of structures in overhead images versus their positions in standard microscope images, making the system self-sufficient and adaptable to any sample carrier

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system dynamically adjusts its measurement approach based on the detected z-position. By changing the reference parameter from fixed sample carrier thickness to dynamically detected apparent position in overhead images, the system adapts to varying sample carrier geometries while maintaining precise distance measurement

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If calibration in the z-direction is not precise, then the system can be assembled without strict tolerances, but the focusing accuracy deteriorates

Engineering Contradiction:
Improveassembly easeVSAvoidfocusing accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The system implements feedback through continuous detection of the sample plane's z-position using the overview camera. This feedback mechanism allows the system to compensate for assembly tolerances and calibration inaccuracies by automatically adjusting the focus based on the detected actual position, rather than relying on pre-set calibration values

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system performs preliminary detection of the sample carrier's z-position before initiating the focusing process. By预先 determining the apparent position of structures in overhead images and calculating the corresponding z-position, the system prepares the correct focus setting in advance, eliminating the need for precise pre-calibration during assembly

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11754392B2Distance determination of a sample plane in a microscope system
Publication Date: 2023.09.12 CARL ZEISS MICROSCOPY GMBH
  • US11754392B2 patent drawing
  • US11754392B2 patent drawing
  • US11754392B2 patent drawing

AI summary

A distance determination system for a microscope system for coarse focus setting includes a sample stage with a placement surface for holding a displaceable sample carrier, an overview camera with a non-telecentric objective for producing digital images, directed at the sample stage, and an evaluation unit, which includes a storage system storing at least two recorded digital images of the sample stage at different viewing angles, a trained machine-learning-based system for identifying corresponding structures of a sample carrier in the sample stage in the two recorded digital images and a distance determination unit, which determines the distance of a reference point of the sample carrier from a reference point of the overview camera based on the different viewing angles onto the sample stage, a pixel distance of the two recorded digital images with respect to one another using the associated corresponding structures contained in the recorded images.