Scanning Microscope Sampling Synchronization for Galvano-Scanner Distortion

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Solution Overview

Problem

Scanning microscopes face challenges in acquiring undistorted images of samples at high speeds due to unstable operation of galvano-scanners driven by serrated waveforms, leading to image distortion and limited scanning ranges when using sinusoidal driving signals, and existing solutions complicate configurations and increase costs.

Innovation Solution

A scanning microscope configuration that includes a scanning unit, optical detection unit, and sampling unit, where the sampling cycle is an integral multiple of a predetermined cycle, allowing for undistorted image acquisition by controlling the sampling based on a sinusoidal driving signal with a sampling enabling signal that adjusts sampling timings to match linear changes in the driving signal, thereby stabilizing the scanning process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If a serrated driving signal is used to drive the scanning mirror at high speed, then scanning speed is improved, but operation stability deteriorates due to increased resonance frequency components

Engineering Contradiction:
Improvescanning speedVSAvoidoperation stability
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent converts the harmful resonance frequency components into a beneficial timing reference. By detecting when the driving signal reaches its maximum value (peak points), the system identifies moments when the scanning mirror is at extreme positions. These peak timing points are then used to generate the sampling clock, transforming the previously harmful resonance effects into a useful synchronization mechanism for distortion-free image acquisition.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Reliability

If a sinusoidal driving signal is used to improve operation stability, then scanning stability is improved, but image distortion occurs due to non-linear amplitude changes

Engineering Contradiction:
Improvescanning stabilityVSAvoidimage distortion
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The system uses feedback by detecting the peak timing points of the sinusoidal driving signal and using these detected timing points to generate the sampling clock. This feedback mechanism ensures that sampling occurs at precise moments when the scanning mirror reaches extreme positions, compensating for the non-linear amplitude changes and eliminating image distortion while maintaining scanning stability.

Inventive Principle:
Principle #23Feedback

3Ease of operation

If sampling is performed at equal time intervals with a sinusoidal driving signal, then sampling simplicity is maintained, but observation image distortion occurs due to non-linear scanning velocity

Engineering Contradiction:
Improvesampling simplicityVSAvoidobservation image distortion
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The patent transitions from static equal-time-interval sampling to dynamic sampling based on the actual scanning mirror position. The sampling interval is dynamically adjusted according to the detected peak timing points of the driving signal, ensuring that sampling occurs at appropriate moments regardless of the non-linear velocity profile. This dynamic approach maintains sampling simplicity while eliminating distortion.

Inventive Principle:
Principle #15Dynamics

4Manufacturing precision

If the scanning mirror is driven at constant velocity to acquire undistorted images, then image quality is improved, but the driving voltage must change non-linearly during direction reversal

Engineering Contradiction:
Improveimage qualityVSAvoiddriving signal complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent extracts only the essential timing information (peak points) from the complex driving signal waveform. Instead of attempting to manage the entire complex waveform with its linear and non-linear portions, the system extracts the useful timing cues at the extreme positions and uses only these extracted timing points for sampling synchronization. This simplifies the overall system while maintaining image quality.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the acquisition of undistorted images of desired sample areas at high speeds with a simple configuration, maintaining image quality and stability without the need for complex hardware or frequency adjustments.

Implementation Method 1

an optical detection unit that receives observation light from a sample and performs photoelectric conversion on the observation light so as to generate an electric signal

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentUS9091861B2Scanning microscope
Publication Date: 2015.07.28 NIKON CORP
  • US9091861B2 patent drawing
  • US9091861B2 patent drawing
  • US9091861B2 patent drawing

AI summary

The present invention relates to a scanning microscope, which can acquire an undistorted image of a desired area of a sample using a simple configuration. When a sample is observed, a galvano-scanner rotates a scanning mirror based on a supplied driving signal, so as to scan the sample with illumination light. A sampling circuit samples an electric signal acquired by performing photoelectric conversion on observation light from the sample, in synchronization with a sampling clock. If the scanning mirror is driven so that the rotation angle thereof non-linearly changes with respect to time, the sampling circuit appropriately suppresses sampling based on the sampling clock, so that sampling is executed only when the scanning mirror is at a predetermined position. The present invention can be applied to a scanning microscope.