Microwave Plasma Unit Groove Layout for Uniform Substrate Processing

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Solution Overview

Problem

Existing substrate processing apparatuses suffer from non-uniform plasma density distribution, leading to inconsistent processing results such as varying etching rates and annealing degrees across the substrate, due to structural limitations in adjusting plasma density.

Innovation Solution

Incorporation of adjustment grooves on the upper plate beneath the antenna plate to modify the electric field distribution, allowing precise control of plasma density uniformity by varying groove depth and position relative to the antenna slots.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the slot shape, position, and distribution in the antenna plate are changed to adjust plasma density, then plasma density uniformity is improved, but structural limitations prevent further optimization

Engineering Contradiction:
Improveplasma density uniformityVSAvoidstructural limitation
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The invention divides the upper plate into multiple regions with different groove depths. By segmenting the plate structure and varying the groove depth in different regions, the electric field distribution is optimized to achieve more uniform plasma density across the substrate processing area, overcoming the limitations of uniform groove designs.

Inventive Principle:
Principle #1Segmentation

2Manufacturing precision

If the transmissive plate shape is changed to adjust plasma density, then plasma density distribution is improved, but particle generation occurs

Engineering Contradiction:
Improveplasma density distributionVSAvoidparticle occurrence
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The invention applies local quality by creating regions with different groove depths in the upper plate. This localized variation in groove depth allows precise control of electric field distribution and plasma density in specific areas without changing the overall transmissive plate shape, thereby avoiding particle generation while achieving uniform plasma density.

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If groove depth in the upper plate is increased to adjust electric field, then plasma density uniformity is improved, but manufacturing complexity increases

Engineering Contradiction:
Improveplasma density uniformityVSAvoidgroove depth variation
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The invention changes the geometric parameter of the upper plate by varying groove depth across different regions. This parameter variation allows control of electric field distribution and plasma density uniformity. The grooves can be formed using standard semiconductor manufacturing techniques, making the solution practically implementable despite the parameter variation.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Improves substrate processing efficiency and uniformity by ensuring consistent plasma density across the processing space, enhancing etching and annealing processes.

Implementation Method 1

a microwave application unit configured to generate plasma from the processing gas supplied to the processing space

Methodology Applied
Scientific EffectPlasma generation: Plasma

Implementation Method 2

generate plasma from processing gas by using a microwave in the processing space 12

Methodology Applied
Scientific EffectMicrowave heating: Dielectric Heating

Implementation Method 3

an adjustment groove configured to adjust an electric field may be formed on an lower surface of the upper plate

Methodology Applied
Scientific EffectElectric field concentration: Electric Field

Data Source

PatentUS12406830B2Apparatus for treating substrate and method for treating substrate
Publication Date: 2025.09.02 SYSTEM ENGINEERING MEGA SOLUTION CO LTD
  • US12406830B2 patent drawing
  • US12406830B2 patent drawing
  • US12406830B2 patent drawing

AI summary

Disclosed is a microwave application unit for applying a microwave to generate plasma. The microwave application unit includes an antenna plate disposed on the support unit and having a plurality of slots; a power supply configured to apply a microwave to the antenna plate; a dielectric plate disposed above the antenna plate to face the antenna plate; an upper plate disposed above the dielectric plate; and a transmissive plate provided below the antenna plate and configured to transmit the microwave to the processing space, wherein an adjustment groove configured to adjust an electric field is formed on an lower surface of the upper plate.