Mixed-Size Memory Cell Blocks for Density and Reliability

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Solution Overview

Problem

The integration and operational reliability of memory cells are limited by the area occupied by unit memory cells, and existing three-dimensional memory structures do not effectively differentiate between normal and critical data storage needs.

Innovation Solution

A memory structure is designed with two types of memory blocks: one for normal data and one for critical data, featuring memory cells of different sizes, and employs differential voltage control and compensation methods for cell current differences to enhance reliability and efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If memory cells are made smaller to increase integration density, then the degree of integration improves, but operational reliability deteriorates

Engineering Contradiction:
Improveintegration densityVSAvoidoperational reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The memory device is divided into multiple memory blocks, each containing memory cells of different sizes. Specifically, the memory device includes first memory blocks with first memory cells and second memory blocks with second memory cells that have larger areas than the first memory cells. This segmentation allows different regions to serve different functional purposes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different memory blocks are assigned different cell sizes based on local requirements. The first memory blocks use smaller cells for normal data storage to maximize density, while the second memory blocks use larger cells for critical data storage to ensure reliability. This local differentiation resolves the contradiction by allowing small cells where density is prioritized and large cells where reliability is prioritized.

Inventive Principle:
Principle #3Local quality

2Ease of manufacture

If uniform memory cell structures are used throughout the memory device, then manufacturing complexity is reduced, but the ability to differentiate between normal and critical data storage needs deteriorates

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoiddata storage differentiation
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The patent implements local quality by creating different memory block types with different cell sizes within the same memory device. The first memory blocks contain first memory cells with a first area, while the second memory blocks contain second memory cells with a second area that is larger than the first area. This allows the memory device to be adapted for different data storage needs in different regions.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The memory device achieves multi-functionality by incorporating multiple memory block types that can handle different data types. The device can simultaneously store normal data in first memory blocks and critical data requiring higher reliability in second memory blocks, making it a universal storage solution that handles various data requirements within a single device.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20260013135A1Memory including memory cells having different sizes
Publication Date: 2026.01.08 SK HYNIX INC
  • US20260013135A1 patent drawing
  • US20260013135A1 patent drawing
  • US20260013135A1 patent drawing

AI summary

A memory may include a first memory block including a plurality of first memory cells; and a second memory block including a plurality of second memory cells each having a larger size than each of the plurality of first memory cells. Normal data may be stored in the first memory block, and critical data requiring reliability may be stored in the second memory block.