Multi-Layered Plunger Assembly for mmW Signal Testing
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Solution Overview
Problem
Current semiconductor testing systems for millimeter wave (mmW) devices face challenges with longer test times, larger physical size, and difficulty in testing devices that transmit mmW signals on both sides due to limitations in conventional plungers, which cannot capture or transmit mmW signals effectively.
Innovation Solution
A test kit with a multi-layered plunger assembly and socket structure that includes an interposer substrate, vacuum gripping nozzles, and ESD control materials to securely hold and test mmW devices, reducing signal loss and enabling simultaneous transmit and receive testing across both sides.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If conventional plungers are used to pick and place DUT in socket, then mechanical handling is achieved, but mmW signal transmission capability is lost
Solution Approach 1:
The plunger assembly is divided into separate functional components: a lower plunger portion for mechanical gripping and placement, and an upper plunger portion with mmW signal transmission capability. This segmentation allows each part to perform its specialized function without compromise.
Solution Approach 2:
An interposer substrate is introduced as an intermediary component between the DUT and the test apparatus. This interposer provides both mechanical support for handling and electrical signal transmission paths for mmW signals, bridging the gap between mechanical and electrical requirements.
2Reliability
If traditional test systems are used, then complete testing functionality is achieved, but test time and physical size increase
Solution Approach 1:
Multiple testing functions are merged into a single integrated test kit assembly. The socket structure, plunger assembly, and interposer substrate are combined to perform both mechanical handling and electrical testing simultaneously, eliminating the need for separate testing equipment and reducing test time.
Solution Approach 2:
The test kit is designed with multi-functionality to handle various mmW devices and perform multiple testing operations. The universal design allows the same apparatus to serve multiple purposes, reducing the overall test time and equipment footprint.
3Reliability
If signal transmission path is extended, then connectivity is achieved, but signal loss increases
Solution Approach 1:
The interposer substrate acts as an intermediary that provides direct, short signal transmission paths between the DUT and test apparatus. By placing the interposer immediately adjacent to the DUT, the signal path length is minimized, reducing signal loss while maintaining connectivity.
Solution Approach 2:
Traditional mechanical cable connections are replaced with direct electrical contacts through the interposer substrate. This substitution eliminates the need for long signal paths through cables and connectors, significantly reducing signal loss in the mmW frequency range.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The test kit reduces test time and physical size, enhances mmW signal performance by minimizing signal transmission path length and achieving reliable mmW signal loopback, making high-volume testing of mmW devices more efficient and cost-effective.
Implementation Method 1
a lower portion of the plunger assembly that vacuum grips the DUT and places the DUT to test site on the socket structure
Implementation Method 2
an interposer substrate installed under the nest... achieving reliable mmW signal loopback
Implementation Method 3
The nest is made of an electrostatic-discharge (ESD) control material or a static-dissipative material
Data Source
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AI summary
This disclosure provides a test kit (1) for testing a device under test, DUT, (130) including a socket structure (10) for containing the DUT (130), and a plunger assembly (20) detachably coupled with the socket structure (10). The plunger assembly (20) includes a multi-layered structure having a nest (230) and an interposer substrate (220) installed under the nest (230).