Test Kit Reflector for mmW Antenna Signal Coupling
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Solution Overview
Problem
Current semiconductor testing systems for millimeter wave (mmW) devices face challenges with longer test times and larger physical sizes, necessitating a more efficient and cost-effective solution for high-volume testing.
Innovation Solution
A test kit comprising a socket structure with a reflector and a plunge structure, including a socket housing, guide plate, heat sink, and pogo pins, designed to securely hold and test devices under test (DUTs) with integrated mmW antennas, utilizing a reflector to enhance RF signal reflection and reception, and vacuum gripping for precise placement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a traditional test system is used for mmW devices, then the device can be tested, but the test time is longer and the physical size is larger
Solution Approach 1:
The test system is divided into separate functional modules: a socket structure for electrical connection, a reflector for RF signal management, and a plunge structure for positioning. This segmentation allows each component to be optimized independently, reducing overall test time while maintaining functionality.
Solution Approach 2:
The reflector is integrated within the socket structure, and the plunge structure is nested within the socket housing. This nesting eliminates the need for separate external components, reducing the physical footprint and test setup time while maintaining all necessary functions.
2Reliability
If a traditional test system is used for mmW devices, then the device can be tested, but the physical size is larger
Solution Approach 1:
The electrical connection function (socket), RF signal reflection (reflector), and positioning function (plunge structure) are merged into a single integrated test kit assembly. This combination maintains full testing capability while significantly reducing the physical space required compared to traditional separate-component systems.
Solution Approach 2:
The reflector utilizes vertical space within the socket housing rather than requiring horizontal expansion. By positioning the reflector beneath the DUT in the vertical dimension, the system maintains RF signal management capability without increasing the horizontal footprint of the test apparatus.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution significantly improves antenna coupling factor while maintaining impedance matching, reducing test time and physical size, and enabling efficient high-volume testing of mmW devices.
Implementation Method 1
The RF signal emitted from the antenna of the DUT is reflected by the reflector and a reflected RF signal is received by the antenna of the DUT
Implementation Method 2
The guide plate comprises a heat sink... for mounting a surface-mounted device, SMD, connector of the DUT
Data Source
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AI summary
A test kit for testing a device under test, DUT, (130) includes a socket structure for containing the DUT (130). The DUT includes an antenna (AT) and radiates a RF signal. The test kit further includes a reflector (230) having a lower surface (230b). The RF signal emitted from the antenna (AT) of the DUT (130) is reflected by the reflector (230) and a reflected RF signal is received by the antenna (AT) of the DUT (130).