Modular CMP System Stacked Polishing and Conditioning

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Solution Overview

Problem

Conventional CMP systems have limited throughput density due to complex and space-consuming first portions, which are hindered by the need for adequate cleaning and reconditioning of polishing pads, leading to increased defect levels and reduced substrate processing efficiency.

Innovation Solution

A modular CMP system with stacked polishing modules, each comprising a system body, platens, and a head assembly, where the linear actuator generates relative motion between the carrier head and the polishing pad, enabling concurrent polishing and ex-situ conditioning operations to enhance throughput density and reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional CMP systems include integrated cleaning and reconditioning stations, then polishing pad maintenance is ensured, but substrate throughput density decreases due to process halts and space consumption

Engineering Contradiction:
Improvepolishing pad maintenance qualityVSAvoidsubstrate throughput density
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system divides the polishing pad maintenance function into separate modular units (cleaning module and reconditioning module) that can operate independently from the polishing stations. This segmentation allows polishing operations to continue while maintenance is performed on separate modules, eliminating throughput bottlenecks.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from a planar arrangement of CMP stations to a three-dimensional stacked configuration where polishing stations are vertically stacked above cleaning and reconditioning modules. This vertical stacking increases throughput density by utilizing the vertical dimension while maintaining compact footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Adaptability or versatility

If polishing systems use complex integrated configurations, then functionality is enhanced, but device complexity and manufacturing floor space increase

Engineering Contradiction:
Improvesystem functionalityVSAvoidsystem configuration complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The system is divided into independent modular units (polishing stations, cleaning modules, reconditioning modules) that can be configured in different stack arrangements. Each module performs a specific function and can be independently maintained or replaced, reducing overall system complexity while maintaining versatility.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The modular design allows the same basic module type to serve multiple functions at different positions in the stack. For example, cleaning modules can service multiple polishing stations, and the system can be reconfigured for different production needs by rearranging modular components.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The modular CMP system achieves increased substrate throughput density and improved reliability by allowing multiple CMP processing operations to be performed simultaneously, while maintaining a compact footprint and reducing complexity and maintenance costs.

Implementation Method 1

a linear actuator connected to a central rail support, and a support arm that couples the carrier head to the linear actuator, wherein the linear actuator is configured to position the carrier head and support arm in the first direction

Methodology Applied
Scientific EffectLinear actuator mechanical actuation: Linear Motor

Data Source

PatentUS20250187138A1Modular chemical mechanical polisher with simultaneous polishing and pad treatment
Publication Date: 2025.06.12 APPLIED MATERIALS INC
  • US20250187138A1 patent drawing
  • US20250187138A1 patent drawing
  • US20250187138A1 patent drawing

AI summary

The present disclosure is directed towards polishing modules for performing chemical mechanical polishing of a substrate. The substrate may be a semiconductor substrate. The polishing modules described have a plurality of pads, such as polishing pads, disposed within a single polishing station. The pads are configured to remain stationary during processing, such as during polishing or buff operations. Either an x-y gantry assembly or a head actuation assembly is coupled to a system body of a polishing module and is configured to move a carrier head over the pads. Between process operations the polishing pads may be indexed to expose a new polishing pad to the carrier head.