Monolithic Multi-Channel Surge Protection Layout for ESD Resilience

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Solution Overview

Problem

Existing semiconductor technologies are inadequate in providing effective multi-channel protection for electronic circuit components against transient voltage surges and electrostatic discharge.

Innovation Solution

A monolithic multiple-channel protection device is designed, featuring semiconductor chips conductively coupled to leads and substrate layers, with encapsulating fill layers and conductive channels, allowing for enhanced impulse surge protection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If existing semiconductor technologies are used for protection devices, then single-channel protection is provided, but multi-channel protection capability is insufficient

Engineering Contradiction:
Improvemulti-channel protection capabilityVSAvoidprotection effectiveness
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The protection device is divided into multiple independent conductive channels, each capable of handling transient voltage surges separately. The device includes a first conductive channel with first and second semiconductor chips, and a second conductive channel with third and fourth semiconductor chips, allowing simultaneous multi-channel protection operations

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple semiconductor chips are integrated into a single monolithic device structure with shared substrate layers and encapsulation. The first and second substrate layers provide common support for all four semiconductor chips, creating a unified multi-channel protection device that combines the functionality of multiple individual protection components

Inventive Principle:
Principle #5Merging (Combining)

2Adaptability or versatility

If multiple semiconductor chips are integrated into a monolithic structure, then multi-channel protection is achieved, but device complexity increases

Engineering Contradiction:
Improvemulti-channel protection capabilityVSAvoidstructural complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The first and second substrate layers serve multiple functions simultaneously: they provide mechanical support for all semiconductor chips, establish electrical connections between chips and external leads, and provide structural framework for the encapsulation process. This multi-functionality reduces the need for additional specialized components

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The semiconductor chips are nested between the first and second substrate layers in a compact stacked arrangement. The fill material is then nested around the chips and substrate layers, creating a dense integrated structure where components are efficiently packed within the monolithic device housing

Inventive Principle:
Principle #7Nested doll (Nesting)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The device effectively protects electronic components from transient voltage surges and electrostatic discharge by providing a robust, multi-channel impulse surge protection mechanism.

Implementation Method 1

Transient voltage suppression (TVS) diodes are electronic components designed to protect sensitive electronics from high voltage transients

Methodology Applied
Scientific EffectTransient voltage suppression: Avalanche Breakdown

Data Source

PatentEP4362092A1Monolithic multiple-channel protection device
Publication Date: 2024.05.01 LITTELFUSE SEMICON WUXI
  • EP4362092A1 patent drawingFigure 1a
  • EP4362092A1 patent drawingFigure 1b
  • EP4362092A1 patent drawingFigure 1c

AI summary

A multiple-channel protection device and associated methods thereof. The device includes a first lead having a first chip attachment portion and a second chip attachment portion, a second lead having a third chip attachment portion, and a third lead having a fourth chip attachment portion. A first semiconductor chip is configured to be conductively coupled to the first chip attachment portion and the third chip attachment portion. A second semiconductor chip is configured to be conductively coupled to the second chip attachment portion and the fourth chip attachment portion.