Movable X-ray Optics for Multi-Path Beam Selection

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Solution Overview

Problem

Conventional X-ray examination devices lack sufficient brilliance, intensity, and flexibility in selecting different beam paths, and are cumbersome to manage, particularly in automated operations.

Innovation Solution

A device comprising an X-ray beam generating system with movable optics components and a rotating stage that allows for the generation of multiple primary X-ray beams with distinct deflection angles, enabling precise alignment and analysis of samples with improved brilliance and intensity, without requiring adjustments to the X-ray source's angular range.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple beam paths are provided with fixed angular ranges, then beam path selection is enabled, but the brilliance and intensity of X-rays are insufficient

Engineering Contradiction:
Improvebeam path selectionVSAvoidX-ray brilliance and intensity
Core Design Contradiction:
Adaptability or versatilityVSIllumination intensity

Solution Approach 1:

The patent applies dynamics by making the optics components movable relative to the X-ray source. Instead of fixed beam paths, the optics components can be positioned at different locations to selectively interact with the original primary X-ray beam, enabling dynamic selection of beam paths while maintaining high brilliance and intensity through optimal positioning.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent segments the beam path selection by providing multiple separate optics components (first optics component, second optics component, etc.) that can be independently positioned. Each optics component can be selectively brought into interaction with the X-ray beam, allowing discrete selection of different beam paths with specific characteristics.

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If conventional aperture systems or monochromators are moved into beam paths, then beam path selection is possible, but the device complexity increases

Engineering Contradiction:
Improvebeam path selectionVSAvoidoptical system complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies universality by providing a movable optics system where the same optical components can serve multiple functions. The optics components can be positioned to interact with the X-ray beam for different beam path selections, and the rotating stage can orient the sample for different angular ranges, creating a multi-functional system that reduces overall complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges the beam path selection function with the sample orientation function by combining the movable optics system with a rotating stage. This integration allows both beam path selection and sample angular positioning to be achieved within a unified system architecture, reducing the number of separate components needed.

Inventive Principle:
Principle #5Merging (Combining)

3Adaptability or versatility

If the X-ray source angular range is adjusted to cover multiple beam paths, then beam path flexibility is improved, but the measurement precision of specific beam paths decreases

Engineering Contradiction:
Improvebeam path flexibilityVSAvoidbeam path alignment precision
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent applies dynamics by using a rotating stage that can precisely orient the sample at specific rotation angles. This dynamic positioning allows the sample to be accurately aligned with the deflected primary X-ray beams, maintaining measurement precision while enabling flexibility in beam path selection through rotational adjustment.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the orientation parameter of the sample by rotating it to specific angles. This parameter adjustment allows precise alignment with the deflected X-ray beams from different optics components, maintaining measurement precision while accommodating different beam path configurations.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enhances the flexibility and quality of X-ray examination by allowing precise selection of beam paths with varying characteristics, improving the brilliance and intensity of X-ray beams, and simplifying the device's operation, including automated modes.

Implementation Method 1

a first primary X-ray beam is generated which is deflected at a first deflection angle, or to bring the second optics component into interaction with the original primary X-ray beam, whereupon a second primary X-ray beam is generated which is deflected at a second deflection angle

Methodology Applied
Scientific EffectX-ray deflection: Reflection

Data Source

PatentUS11906448B2X-ray device having multiple beam paths
Publication Date: 2024.02.20 ANTON PAAR GMBH
  • US11906448B2 patent drawing
  • US11906448B2 patent drawing
  • US11906448B2 patent drawing

AI summary

An X-ray beam generating system including an X-ray source for generating an original primary X-ray beam, an optics system including a first optics component and at least one second optics component which are movable relative to the X-ray source in order either to bring the first optics component into interaction with the original primary X-ray beam, whereupon a first primary X-ray beam is generated which is deflected at a first deflection angle, or to bring the second optics component into interaction with the original primary X-ray beam, whereupon a second primary X-ray beam is generated which is deflected at a second deflection angle, and a rotating device to rotate the X-ray beam generating system through either a first rotation angle or a second rotation angle to allow either the first primary X-ray beam or the second primary X-ray beam to impinge on a sample region.