MRAM Pulse Generator Circuit With Tunable Width and Amplitude
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Solution Overview
Problem
Conventional methods for testing magnetoresistive random access memory (MRAM) require expensive MTJ data sources and additional tools, leading to high costs and throughput bottlenecks due to the need for generating very short pulse signals.
Innovation Solution
A pulse signal generator system comprising a delay chain circuit, NAND gate, and amplitude tunable inverter, which allows for the generation of pulse signals with user-defined pulse width and amplitude, using a delay chain circuit to adjust pulse width and an amplitude tunable inverter to adjust pulse amplitude, thereby reducing complexity and cost.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional MTJ data source methods are used to generate very short pulse signals for MRAM testing, then the required pulse signal generation capability is achieved, but the system complexity and cost increase due to requiring additional expensive tools and hardware
Solution Approach 1:
The pulse signal generator is integrated into the existing MRAM testing system, allowing the same hardware to perform both normal memory operations and pulse signal generation for testing. This eliminates the need for separate dedicated pulse generation equipment, reducing overall system complexity while maintaining the required pulse signal generation capability
Solution Approach 2:
The patent combines the pulse signal generation functionality with the existing testing infrastructure by integrating a delay circuit and control logic into the current test equipment. This merging approach consolidates multiple functions into a single system, reducing the number of separate components and lowering system complexity
2Manufacturing precision
If conventional MTJ data source methods are used for MRAM testing, then the required pulse signal generation is achieved, but the testing cost increases due to requiring expensive additional tools
Solution Approach 1:
The integrated pulse signal generator utilizes existing hardware resources in the testing system, making the equipment multi-functional. This eliminates the need to purchase separate expensive pulse generation tools, thereby reducing testing costs while maintaining the required pulse signal generation capability
Solution Approach 2:
The system uses its own existing components and resources to generate the required pulse signals for testing, rather than relying on external specialized equipment. This self-service approach reduces dependency on expensive external tools and lowers overall testing costs
3Manufacturing precision
If very short pulse signals are generated using conventional methods, then the MRAM testing requirement is met, but the throughput decreases due to creating bottlenecks in the testing process
Solution Approach 1:
The delay circuit is pre-configured with multiple delay stages that can generate the required short pulse widths without requiring complex real-time signal processing during testing. This preliminary preparation of pulse generation capabilities eliminates processing bottlenecks and maintains high testing throughput
Data Source
AI summary
A pulse signal generator system for a magnetoresistive random access memory includes a delay chain circuit, a NAND gate, an amplitude tunable inverter, and a memory array. The delay chain circuit is used to receive an input signal and generate a delayed output signal. The NAND gate is coupled to the delay chain circuit. The NAND gate includes a first input terminal for receiving the input signal, a second input terminal for receiving the delayed output signal, and an output terminal for outputting a first pulse signal. The amplitude tunable inverter is coupled to the NAND gate. The amplitude tunable inverter includes an input terminal for receiving the first pulse signal, and an output terminal for outputting a second pulse signal. The memory array is coupled to the amplitude tunable inverter.