MTJ Free Layer Nano-Pore Structure for Lower Saturation Magnetization

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Magnetic memory devices face challenges in reducing saturation magnetization without causing agglomeration due to thickness reduction or introducing additional elements, leading to increased write error rates and magnetic interference.

Innovation Solution

A magnetic tunnel junction structure with a nano-pore structure in the second magnetic layer is formed, reducing saturation magnetization without altering the thickness or adding elements, maintaining perpendicular magnetic anisotropy to minimize magnetic interference.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the thickness of the storage layer is reduced to decrease saturation magnetization, then saturation magnetization is reduced, but agglomeration occurs

Engineering Contradiction:
Improvesaturation magnetizationVSAvoidagglomeration
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent introduces a porous insulation layer within the storage layer structure. This porous layer has low density and high porosity, which reduces the overall saturation magnetization of the storage layer without requiring thickness reduction. The porous structure prevents agglomeration by providing spatial separation between magnetic particles, thus resolving the contradiction between reducing saturation magnetization and preventing agglomeration.

Inventive Principle:
Principle #31Porous materials

2Quantity of substance

If additional elements are introduced to reduce saturation magnetization, then saturation magnetization is reduced, but device complexity increases

Engineering Contradiction:
Improvesaturation magnetizationVSAvoidadditional elements
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent uses a porous insulation layer made from existing materials (such as porous oxides or carbons) that can be deposited using standard semiconductor fabrication processes. This approach reduces saturation magnetization without introducing entirely new material systems, thereby minimizing the increase in device complexity while achieving the desired magnetization reduction.

Inventive Principle:
Principle #31Porous materials

3Quantity of substance

If the thickness of the storage layer is reduced, then saturation magnetization is reduced, but magnetic interference increases

Engineering Contradiction:
Improvesaturation magnetizationVSAvoidmagnetic interference
Core Design Contradiction:
Quantity of substanceVSObject-generated harmful factors

Solution Approach 1:

The porous insulation layer acts as a magnetic spacer that reduces magnetic coupling between adjacent magnetic particles. By introducing this porous layer, the patent reduces saturation magnetization while simultaneously minimizing magnetic interference through the insulating properties of the porous material, thus resolving the contradiction between magnetization reduction and interference minimization.

Inventive Principle:
Principle #31Porous materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The nano-pore structure effectively decreases saturation magnetization by approximately 50% without agglomeration, reducing write error rates and magnetic interference, while maintaining fast operation speeds and low voltage requirements.

Implementation Method 1

a second magnetic layer formed adjacent to the first magnetic layer to be spaced apart from the tunnel barrier layer and including nano-pores within the second magnetic layer

Methodology Applied
Scientific EffectPorosity: Porosity

Implementation Method 2

a magnetic tunnel junction (MTJ) structure that comprises: a pinned layer having a fixed magnetization direction; a tunnel barrier layer formed adjacent to the pinned layer; and a free layer formed adjacent to the tunnel barrier layer

Methodology Applied
Scientific EffectQuantum tunneling:

Implementation Method 3

maintaining perpendicular magnetic anisotropy to minimize magnetic interference

Methodology Applied
Scientific EffectMagnetic anisotropy: Anisotropy

Data Source

PatentUS20260013398A1Semiconductor device and method for fabricating the same
Publication Date: 2026.01.08 SK HYNIX INC
  • US20260013398A1 patent drawing
  • US20260013398A1 patent drawing
  • US20260013398A1 patent drawing

AI summary

Semiconductor devices and fabrication methods are disclosed. In an embodiment, a semiconductor device includes: a magnetic tunnel junction (MTJ) structure that comprises: a pinned layer having a fixed magnetization direction; a tunnel barrier layer formed adjacent to the pinned layer; and a free layer formed adjacent to the tunnel barrier layer and having a changeable magnetization direction. The free layer comprises: a first magnetic layer formed adjacent to the tunnel barrier layer; and a second magnetic layer formed adjacent to the first magnetic layer to be spaced apart from the tunnel barrier layer and including nano-pores within the second magnetic layer.