Multi-Axis Sensor Positioning for Container Thickness Measurement
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Solution Overview
Problem
Existing methods for measuring the wall thickness and properties of glass and plastic containers, such as capacitive and optical techniques, are limited in accuracy and the quantity of information they provide, making them inadequate for effectively controlling the container-making process.
Innovation Solution
A system utilizing a multi-axis sensor positioning device for optical non-contact sensors, allowing for precise positioning and measurement of container properties like wall thickness and surface topology, using chromatic or other optical techniques to derive accurate measurements by maintaining the sensor at optimal angles and distances relative to the container surface.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If capacitive or optical techniques are used to measure container thickness, then measurement capability is provided, but measurement precision and information quantity are limited
Solution Approach 1:
The patent segments the measurement process into multiple discrete steps: positioning the sensor at specific angles, taking measurements at multiple locations, and systematically mapping different container surfaces. This segmentation allows comprehensive information collection while maintaining measurement precision at each step.
Solution Approach 2:
The patent transitions from single-point thickness measurement to multi-dimensional surface topology mapping. By adding angular positioning and multiple measurement locations, the system captures three-dimensional surface information, transforming limited one-dimensional thickness data into comprehensive multi-dimensional container surface maps.
2Measurement precision
If non-contact optical sensors are used, then contactless measurement is achieved, but positioning accuracy and measurement optimality are compromised
Solution Approach 1:
The patent employs a dynamic multi-axis positioning system that can adjust sensor position and orientation in real-time. The system dynamically positions the sensor at optimal angles relative to the container surface, maintaining measurement precision while adapting to different measurement locations and container geometries.
Solution Approach 2:
The patent introduces a multi-axis positioning device as an intermediary between the optical sensor and the container. This positioning system serves as a mediator that precisely controls sensor placement and orientation, enabling accurate non-contact measurements while managing the complexity through a dedicated positioning mechanism.
3Manufacturing precision
If existing thickness measuring devices are used, then basic thickness indication is provided, but process control capability is insufficient
Solution Approach 1:
The patent implements comprehensive surface topology mapping that provides detailed feedback about container wall thickness and surface properties. This feedback information, including variations in thickness and surface characteristics across the entire container surface, enables precise control of the container-making process by identifying specific areas needing adjustment.
Solution Approach 2:
The patent performs complete surface mapping and topology analysis before final container evaluation. By systematically measuring and mapping the entire container surface in advance, the system prepares comprehensive data that enables better process control decisions, allowing manufacturers to identify and correct issues before they affect production efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy and quantity of information obtained, enabling better control of the container-making process by providing detailed mappings of container properties, improving the precision of thickness and surface topology measurements.
Implementation Method 1
sensors and emitters are deployed and used to direct radiation towards the container. Mathematical techniques are used to derive container thickness, based on the radiation either reflected or absorbed
Implementation Method 2
sensors and emitters are deployed and used to direct radiation towards the container. Mathematical techniques are used to derive container thickness, based on the radiation either reflected or absorbed
Implementation Method 3
utilizing optical non-contact techniques... chromatic optical techniques may provide superior results when the sensor is pointed in a direction about normal to the container surface
Data Source
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AI summary
Various embodiments are directed to systems and methods for measuring a thickness of a container. For example, a control device may receive data indicating a surface topology of the container and based on the surface topology of the container, instruct a multi-axis positioning system to position a sensor relative to a first point of the container such that: a distance from the sensor to a surface at the first point is about equal to a predetermined distance; and the sensor direction is about normal to the surface at the first point. Data indicating the thickness at the first point may be received from the sensor.