Multi-Domain Rent's Rule for IC Wirelength Distribution
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Solution Overview
Problem
Conventional Rent's rule is inadequate for accurately deriving wirelength distribution in integrated circuits, particularly due to its limitations in handling multiple domains and providing early power and performance estimates, which are critical for optimization and design refinement.
Innovation Solution
A multi-domain based Rent's rule is introduced, defining Rent's parameters for multiple domains such as standard cell, functional implementation, and chip periphery domains, allowing for more accurate relations between input/output connections and cell count, and incorporating fan-out patterns for improved wirelength distribution prediction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional Rent's rule is used to derive wirelength distribution, then the method is simple to implement, but the accuracy of wirelength estimation is insufficient
Solution Approach 1:
The patent segments the integrated circuit into multiple domains (standard cell domain, functional implementation domain, chip periphery domain) and applies separate Rent's rule parameters to each domain. This segmentation allows for more accurate wirelength estimation by capturing the distinct wiring characteristics of each domain while maintaining a structured approach that avoids complete model overhaul.
Solution Approach 2:
The patent introduces domain-specific Rent's parameters (k and p values) tailored to each specific domain's wiring characteristics. Instead of using a single global model, each domain receives localized parameter optimization, thereby improving estimation accuracy for that particular domain while keeping the overall framework manageable.
2Measurement precision
If conventional Rent's rule is used, then the analysis process is fast, but it cannot provide accurate early power and performance estimates
Solution Approach 1:
The patent enables preliminary power and performance estimation by applying the multi-domain Rent's rule during early design stages. By establishing domain-specific parameters beforehand and using them for initial wirelength distribution analysis, designers can perform preliminary power and performance evaluations without waiting for complete detailed routing, thus reducing design optimization time while improving accuracy.
3Reliability
If a single-domain Rent's rule is applied, then the model is simple, but it fails to capture wiring characteristics across different circuit domains
Solution Approach 1:
The patent divides the circuit into distinct domains (standard cell, functional implementation, chip periphery) with separate Rent's rule applications for each. This segmentation captures the unique wiring characteristics of each domain while maintaining a systematic framework that prevents the complexity from becoming unmanageable.
Solution Approach 2:
The patent creates a universal multi-domain Rent's rule framework that can handle different circuit domains through a common methodology. Each domain uses the same basic Rent's rule formulation but with domain-specific parameters, providing both specialization for accuracy and universality for ease of application across the entire circuit.
Data Source
AI summary
Implementations described herein are directed to a device with a processor and memory having stored thereon instructions that, when executed by the processor, cause the processor to acquire an integrated circuit layout of physical cells from a database and define wirelength relationships between input/output connections and a cell count for the physical cells in multiple domains. The instructions may cause the processor to define wirelength parameters of the integrated circuit layout in each domain of the multiple domains and generate a data file for the integrated circuit layout of the physical cells based on the wirelength relationships and the wirelength parameters to guide power and performance of the integrated circuit layout of the physical cells. The instructions may cause the processor to fabricate, or contribute to the fabrication of, an integrated circuit based on the data file for the integrated circuit layout of the physical cells.